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CAS IR Grid
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金属研究所 [2]
长春光学精密机械与物... [1]
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OAI收割 [3]
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期刊论文 [2]
会议论文 [1]
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2019 [2]
2006 [1]
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Tailoring Nanoporous Structures in Bi2Te3 Thin Films for Improved Thermoelectric Performance
期刊论文
OAI收割
ACS APPLIED MATERIALS & INTERFACES, 2019, 卷号: 11, 期号: 41, 页码: 38075-38083
作者:
Qiao, Jixiang
;
Zhao, Yang
;
Jin, Qun
;
Tang, Jun
;
Kang, Siqing
  |  
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2021/02/02
thin film thermoelectrics
nanoporous structure
pore interval
Bi2Te3
phonon backscattering
Tailoring Nanoporous Structures in Bi2Te3 Thin Films for Improved Thermoelectric Performance
期刊论文
OAI收割
ACS APPLIED MATERIALS & INTERFACES, 2019, 卷号: 11, 期号: 41, 页码: 38075-38083
作者:
Qiao, Jixiang
;
Zhao, Yang
;
Jin, Qun
;
Tang, Jun
;
Kang, Siqing
  |  
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2021/02/02
thin film thermoelectrics
nanoporous structure
pore interval
Bi2Te3
phonon backscattering
Raman spectra and phonon modes of MgxZn1-xO alloy films (EI CONFERENCE)
会议论文
OAI收割
12th International Conference on II-VI Compounds, September 12, 2005 - September 16, 2005, Warsaw, Poland
Wei Z. P.
;
Lu Y. M.
;
Shen D. Z.
;
Zhang Z. Z.
;
Wu C. X.
;
Zhang J. Y.
;
Yao B.
;
Fan X. W.
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2013/03/25
Hexagonal MgxZn1-xO alloy layers with 0 &le 0.3 have been grown by plasma-assisted molecular beam epitaxy on sapphire (006) and Si (111) substrates. Their crystal structures are characterized by x-ray diffraction spectroscopy. The nonresonant and resonant Raman spectra were measured using 488 nm line from Ar+ laser
and 325 nm line from He-Cd laser by backscattering geometry. Four Raman modes (E2 high
LO
TO
multiphonon processes) were observed in the nonresonant Raman spectra of hexagonal MgxZn1-xO with different Mg contents. The optical phonon frequencies were found to display one-mode behaviour for all the samples since no separate ZnO- and MgO-like modes were observed. The long-wavelength frequencies of ZnO-like optical phonons measured in the resonant Raman spectra can be expressed as linear functions of x. These behaviours can be explained within a modified random-element-isodisplacement model (MREI). 2006 WILEY-VCH Verlag GmbH Co. KGaA.