中国科学院机构知识库网格系统: 检索

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	Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE) 会议论文 OAI收割 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China Yang P.; Ai H. 收藏 \|
	Design and tolerance analysis of compensator for high order aspheric surface testing (EI CONFERENCE) 会议论文 OAI收割 2009 International Conference on Optical Instruments and Technology - Optoelectronic Measurement Technology and Systems, October 19, 2009 - October 22, 2009, Shanghai, China 作者: Chen X.; Liu W.; Chen X.; Chen X. 收藏 \|
	Design of dual-FOV refractive/diffractive LWIR optical system (EI CONFERENCE) 会议论文 OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者: Wang L.-J.; Zhang J.-P.; Wang L.-J.; Zhang X.; Zhang X. 收藏 \|
	The research of chromatic aberration arose from the deviation of same function family at the single primary in full-color display (EI CONFERENCE) 会议论文 OAI收割 ICO20: Illumination, Radiation, and Color Technologies, August 21, 2005 - August 26, 2005, Changchun, China 作者: Chen Y. 收藏 \|