中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共1条,第1-1条 帮助

条数/页: 排序方式:
Application of interferometry measurement in large-scale optic-electrical theodolite (EI CONFERENCE) 会议论文  OAI收割
2012 International Conference on Sensors, Measurement and Intelligent Materials, ICSMIM 2012, December 26, 2012 - December 27, 2012, Guilin, China
作者:  
Sun Z.
收藏  |  浏览/下载:39/0  |  提交时间:2013/03/25
Interferometry is a very important method in high accuracy measurement for optical system. This article briefly introduced the conception of interferometry and took a product of 4D Technology as an example to carry on the measurement. A large-scale optic-electrical Theodolite in assemblage was measured  and its primary mirror was 400mm in diameter. With the analysis of the results  some micro adjustments of the mechanical structure proceed  and it made the system perform better. The final results of the whole system is 1.061 in P-V value and 0.1136 in RMS value (=632.8nm)  this meets the demand of optical design and practical application. The result demonstrates that interferometry is a good way to be utilized and optimize in the procedure of assemble. (2013) Trans Tech Publications  Switzerland.