机构

• 西安光学精密机械研究... [3]
• 长春光学精密机械与物... [1]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2013 [1]
• 2012 [2]
• 2010 [1]

学科主题

• optics [1]

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Theoretical analysis of scanning spectral filter method for coherent intensity contrast enhancement in femtosecond laser system 期刊论文  OAI收割 acta physica sinica, 2013, 卷号: 62, 期号: 15 作者:  Ma Zai-Ru;  Sui Zhan;  Zhou Gui-Yong;  Sun Nian-Chun;  Wang Yi-Shan 收藏  |  浏览/下载：38/0  |  提交时间：2015/06/09 ultrafast optics  coherent pulse contrast  spectral scanning filtering  short time Fourier transformation   Theoretical Analysis on scanning spectral filter based on the bi-refraction electro-optical interferometer for pulse contrast improvement in femtosecond laser 期刊论文  OAI收割 optics communications, 2012, 卷号: 285, 期号: 12, 页码: 2883-2888 作者:  Ma, Zairu;  Sui, Zhan;  Feng, Guoying;  Sun, Nianchun;  Wang, Yishan 收藏  |  浏览/下载：15/0  |  提交时间：2012/09/04 Ultrafast optics  Wavelength filtering devices  Spectral scanning filter   Theoretical analysis on scanning spectral filter method for signal-noise-ratio improvment in femtosecond laser system 期刊论文  OAI收割 acta physica sinica, 2012, 卷号: 61, 期号: 7 作者:  Ma Aai-Ru;  Sui Zhan;  Feng Guo-Ying;  Sun Nian-Chun;  Wang Yi-Shan 收藏  |  浏览/下载：33/0  |  提交时间：2015/06/30 ultrafast optics  ultrafast technology  spectral scanning filtering  short time fourier transform   White-light spectral scanning interferometry for surface measurement system (EI CONFERENCE) 会议论文  OAI收割 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China 作者:  Wang C. 收藏  |  浏览/下载：26/0  |  提交时间：2013/03/25 The paper introduces the white-light spectral scanning interferometry for surface measurement. This interferometry can be used to measure the roughness of both smooth surfaces and those with large step heights. This real-time surface measurement can be achieved using acousto-optic tuneable filtering (AOTF) technique without mechanical scanning. At first  the structure and principle of this interferometry is introduced. Then the algorithm of the surface roughness measurement is proposed. What's more  the experiment with standard test piece is conducted. Compared with the traditional laser-light interferometry  the data shows that the proposed method has a higher accuracy which is proved to be nano-scale. A conclusion is given at last in which the superiorities and the limitations of the proposed system were discussed. 2010 SPIE.