机构

• 物理研究所 [1]
• 长春光学精密机械与物... [1]
• 半导体研究所 [1]

采集方式

• OAI收割 [3]

内容类型

• 期刊论文 [2]
• 会议论文 [1]

发表日期

• 2013 [1]
• 2011 [1]
• 2010 [1]

学科主题

• 半导体物理 [1]

筛选

浏览/检索结果: 共3条，第1-3条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 Adsorption and Diffusion of Lithium on Layered Silicon for Li-Ion Storage 期刊论文  OAI收割 NANO LETTERS, 2013, 卷号: 13, 期号: 5, 页码: 2258 Tritsaris, GA; Kaxiras, E; Meng, S; Wang, EG 收藏  |  浏览/下载：37/0  |  提交时间：2014/01/16 Lithium-ion battery  energy storage  two-dimensional silicon  adatom adsorption  surface diffusion  ab initio calculations   Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文  OAI收割 2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China 作者:  Chen B.;  Chen B. 收藏  |  浏览/下载：29/0  |  提交时间：2013/03/25 A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.   STUDY ON MICROWAVE CYCLOTRON RESONANCE OF HIGH-MOBILITY GaAs/Al-0.35 Ga-0.65 As TWO-DIMENSIONAL ELECTRON GAS 期刊论文  OAI收割 journal of infrared and millimeter waves, JOURNAL OF INFRARED AND MILLIMETER WAVES, 2010, 2010, 卷号: 29, 29, 期号: 2, 页码: 87-, 87- 作者:  Yang W (Yang Wei);  Luo HH (Luo Hai-Hui);  Qian X (Qian Xuan);  Ji Y (Ji Yang);  Yang, W, Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China. 电子邮箱地址: jiyang@semi.ac.cn   |  收藏  |  浏览/下载：102/0  |  提交时间：2010/05/24 microwave  Microwave  Reflectance  Two-dimensional Electron Gas(2deg)  Cyclotron Resonance  Quantum-wells  Gaas/algaas Heterostructures  Germanium  Silicon  reflectance  two-dimensional electron gas(2DEG)  cyclotron resonance  QUANTUM-WELLS  GAAS/ALGAAS HETEROSTRUCTURES  GERMANIUM  SILICON