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CAS IR Grid
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长春光学精密机械与物... [1]
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OAI收割 [1]
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会议论文 [1]
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2010 [1]
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Image registration based on log-polar transform and SIFT features (EI CONFERENCE)
会议论文
OAI收割
2010 International Conference on Computational and Information Sciences, ICCIS2010, December 17, 2010 - December 19, 2010, Chengdu, Sichuan, China
作者:
Liu Y.
;
Liu Y.
;
Liu Y.
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浏览/下载:27/0
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提交时间:2013/03/25
This paper describes a novel image registration method that combines log-polar transform and SIFT to recover similarity transformations (rotation/ scale/ translation).We extracts SIFT feature points in the two images firstly. Then
we use threshold Euclidean distance to coarsely match the feature points. After that
the log-polar transform is applied to compute the rotation and scale parameters. And we can obtain the translation parameter by the location relationship of the feature points. 2010 IEEE.