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Chinese Academy of Sciences Institutional Repositories Grid
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  • 光电技术研究所 [4]
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Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文  OAI收割
作者:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei
  |  收藏  |  浏览/下载：34/0  |  提交时间：2018/12/20
Measurement of non-common path static aberrations in an interferometric camera by phase diversity 会议论文  OAI收割
Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 2012
作者:  Yan, Zhaojun;  Herbst, Thomas M.;  Yang, Pengqian;  Bizenberger, Peter;  Zhang, Xianyu
收藏  |  浏览/下载：16/0  |  提交时间：2016/11/24
Comparative analysis of three-position measurement technology and multi-positions average measurement technology 会议论文  OAI收割
Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 2012
作者:  Yang, Peng;  Wu, Fan;  Hou, Xi
收藏  |  浏览/下载：8/0  |  提交时间：2016/11/24
Resolution enhancement of photon sieve based on apodization 会议论文  OAI收割
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Cheng, GX; Xing, TW; Liao, ZJ; et al.
收藏  |  浏览/下载：9/0  |  提交时间：2015/05/18