机构

• 长春光学精密机械与物... [4]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2017 [1]
• 2015 [2]
• 2009 [1]

学科主题

筛选

浏览/检索结果: 共4条，第1-4条 帮助 限定条件 专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Inverse Design of Dielectric Resonator Cloaking Based on Topology Optimization 期刊论文  OAI收割 Plasmonics, 2017, 卷号: 12, 期号: 6 作者:  Deng, Y. B.;  Z. Y. Liu;  Y. M. Liu and Y. H. Wu   |  收藏  |  浏览/下载：9/0  |  提交时间：2018/06/13 Studying of photoluminescence characteristics of CdTe/ZnS QDs manipulated by TiOinf2/inf inverse opal photonic crystals 期刊论文  OAI收割 Optical Materials, 2015, 卷号: 46 作者:  Chi, X.-C.;  Y.-S. Yang;  Y.-H. Wang;  J.-C. Gao;  N. Sui 收藏  |  浏览/下载：9/0  |  提交时间：2016/07/21 Studying of photoluminescence characteristics of CdTe/ZnS QDs manipulated by TiO2 inverse opal photonic crystals 期刊论文  OAI收割 Optical Materials, 2015, 卷号: 46, 页码: 350-354 作者:  Chi, X. C.;  Y. S. Yang;  Y. H. Wang;  J. C. Gao;  N. Sui 收藏  |  浏览/下载：16/0  |  提交时间：2016/07/15 Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文  OAI收割 Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C. 收藏  |  浏览/下载：16/0  |  提交时间：2013/03/25 A soft x-ray reflectometer with laser produced plasma source has been designed  which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above  the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand  both the two samples are measured by WYKO surface profiler  and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler  which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO  and the possible reasons of such difference have been discussed in detail. 2009 SPIE.