中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
  • 半导体研究所 [2]
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发表日期
  • 1998 [2]
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Triclinic deformation and anisotropic strain relaxation of an inas film on a gaas(001) substrate measured by a series of symmetric double crystal x-ray diffraction 期刊论文  iSwitch采集
Journal of crystal growth, 1998, 卷号: 191, 期号: 4, 页码: 627-630
作者:  
Wang, HM;  Zeng, YP;  Zhou, HW;  Kong, MY
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Triclinic deformation and anisotropic strain relaxation of an InAs film on a GaAs(001) substrate measured by a series of symmetric double crystal X-ray diffraction 期刊论文  OAI收割
journal of crystal growth, 1998, 卷号: 191, 期号: 4, 页码: 627-630
Wang HM; Zeng YP; Zhou HW; Kong MY
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