机构

• 半导体研究所 [20]

采集方式

• OAI收割 [20]

内容类型

• 期刊论文 [15]
• 会议论文 [5]

发表日期

• 2012 [1]
• 2011 [2]
• 2009 [2]
• 2008 [2]
• 2007 [2]
• 2006 [3]
• 更多

学科主题

• 光电子学 [20]

筛选

浏览/检索结果: 共20条，第1-10条 帮助 限定条件 学科主题：光电子学     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Interfacial misfit dislocation scattering effect in two-dimensional electron gas channel of GaN heterojunction 期刊论文  OAI收割 physics letters a, 2012, 卷号: 376, 期号: 2012-10-11, 页码: 1067-1071 Liu, B; Lu, YW; Huang, Y; Liu, GP; Zhu, QS; Wang, ZG 收藏  |  浏览/下载：15/0  |  提交时间：2013/03/17 Localized flexible integration of high-efficiency surface enhanced Raman scattering (SERS) monitors into microfluidic channels 期刊论文  OAI收割 lab on a chip, 2011, 卷号: 11, 期号: 19, 页码: 3347-3351 Xu, BB; Ma, ZC; Wang, L; Zhang, R; Niu, LG; Yang, Z; Zhang, YL; Zheng, WH; Zhao, B; Xu, Y; Chen, QD; Xia, H; Sun, HB 收藏  |  浏览/下载：19/0  |  提交时间：2012/02/06 MICROCHIP ELECTROPHORESIS  RESONANCE RAMAN  SINGLE-MOLECULE  GLUCOSE-OXIDASE  SILVER  CHIP  SPECTROSCOPY  NANOPARTICLES  SPECTROMETRY  FABRICATION   Optical properties of the crescent and coherent applications 期刊论文  OAI收割 optics express, 2011, 卷号: 19, 期号: 9, 页码: 8303-8311 作者:  Jiang B;  Yan XY 收藏  |  浏览/下载：62/7  |  提交时间：2011/07/06 ENHANCED RAMAN-SCATTERING  GOLD NANOPARTICLES  RESONANCE  SPECTROSCOPY  NANOCAVITIES   Experimental investigation on submicron rib waveguide microring/racetrack resonators in silicon-on-insulator 期刊论文  OAI收割 optics communications, 2009, 卷号: 282, 期号: 1, 页码: 22-26 Huang, QZ; Yu, YD; Yu, JZ 收藏  |  浏览/下载：50/0  |  提交时间：2010/03/08 Resonators  Submicron rib waveguides  Silicon-on-insulator  Polarization   Revised ab initio natural band offsets of all group IV, II-VI, and III-V semiconductors 期刊论文  OAI收割 applied physics letters, 2009, 卷号: 94, 期号: 21, 页码: art. no. 212109 作者:  Li JB 收藏  |  浏览/下载：112/0  |  提交时间：2010/03/08 ab initio calculations  band structure  cadmium compounds  III-V semiconductors  II-VI semiconductors  IV-VI semiconductors  zinc compounds   Investigation on the structural origin of n-type conductivity in InN films 期刊论文  OAI收割 journal of physics d-applied physics, 2008, 卷号: 41, 期号: 13, 页码: art. no. 135403 Wang, H; Jiang, DS; Wang, LL; Sun, X; Liu, WB; Zhao, DG; Zhu, JJ; Liu, ZS; Wang, YT; Zhang, SM; Yang, H 收藏  |  浏览/下载：53/1  |  提交时间：2010/03/08 MOLECULAR-BEAM EPITAXY  GAN FILMS  DISLOCATION SCATTERING  LAYER THICKNESS  INDIUM NITRIDE  BAND-GAP  VACANCIES   Native deep level defects in ZnO single crystal grown by CVT method - art. no. 68410I 会议论文  OAI收割 conference on solid state lighting and solar energy technologies, beijing, peoples r china, nov 12-14, 2007 Zhao, YW; Zhang, F; Zhang, R; Dong, ZY; Wei, XC; Zeng, YP; Li, JM 收藏  |  浏览/下载：43/0  |  提交时间：2010/03/09 zinc oxide  defect  vacancy   Does an enhanced yellow luminescence imply a reduction of electron mobility in n-type GaN? 期刊论文  OAI收割 journal of applied physics, 2007, 卷号: 102, 期号: 11, 页码: art. no. 113521 Zhao, DG; Jiang, DS; Zhu, JJ; Liu, ZS; Zhang, SM; Liang, JW; Yang, H 收藏  |  浏览/下载：50/5  |  提交时间：2010/03/08 CHEMICAL-VAPOR-DEPOSITION  MOLECULAR-BEAM EPITAXY  X-RAY-DIFFRACTION  MG-DOPED GAN  UNDOPED GAN  PHOTOLUMINESCENCE BANDS  THREADING DISLOCATIONS  POSITRON-ANNIHILATION  GROWTH STOICHIOMETRY  GALLIUM NITRIDE   An n-type SiGe/Ge QC structure utilizing the deep Ge quantum well for electron at the Gamma point 期刊论文  OAI收割 semiconductor science and technology, 2007, 卷号: 22, 期号: 7, 页码: 769-773 Han GQ (Han Genquan); Yu JZ (Yu Jinzhong) 收藏  |  浏览/下载：64/0  |  提交时间：2010/03/29 CASCADE STRUCTURES   Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate 期刊论文  OAI收割 journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654 Zhao L (Zhao Lei); Zuo YH (Zuo Yuhua); Cheng BW (Cheng Buwen); Yu JZ (Yu Jinzhong); Wang QM (Wang Qiming) 收藏  |  浏览/下载：37/0  |  提交时间：2010/04/11 Si1_xGex  Ge content  composition determination  double crystals X-ray diffraction (DCXRD)  micro-Raman measurement  BAND-GAP  HETEROSTRUCTURES  SUPERLATTICES  ALLOYS  RELAXATION  SCATTERING  THICKNESS  STRAIN