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	Determination the optical constants of hafnium oxide film by Spectroscopic ellipsometry with various dispersion models 会议论文 OAI收割 Proceedings of the SPIE - The International Society for Optical Engineering, 2010 作者: Weidong Gao; Yinhua Zhang; Hongxiang Liu 收藏 \| 浏览/下载：15/0 \| 提交时间：2016/11/25
	Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者: 收藏 \| 浏览/下载：11/0 \| 提交时间：2013/03/25 We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First we obtained the structure information (the layer thickness surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second based on the acquired structure information the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally the optical band gap is verified by Taue plot method which is well consistent with that of SE.
	Surface modification of polyethylene terephthalate implanted by argon ions 会议论文 OAI收割作者: Yang, SR; Sun, YM; Zhu, ZY; Liu, WM; Li, CL \| 收藏 \| 浏览/下载：9/0 \| 提交时间：2018/08/20 surface modification argon ion implantation polyethylene terephthalate
	Surface modification of polyethylene terephthalate implanted by argon ions 会议论文 OAI收割作者: Zhu, ZY; Sun, YM; Li, CL; Liu, WM; Yang, SR \| 收藏 \| 浏览/下载：10/0 \| 提交时间：2018/08/20 surface modification argon ion implantation polyethylene terephthalate