中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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  • 2015 [119]
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Influence of ultra-thin TiN thickness (1.4 nm and 2.4 nm) on positive bias temperature instability (PBTI) of high-k/metal gate nMOSFETs with gate-last process 期刊论文  OAI收割
Chinese Physics B, 2015
作者:  
Qi LW(祁路伟);  Wang WW(王文武)
  |  收藏  |  浏览/下载:11/0  |  提交时间:2016/10/28
Influence of ultra-thin TiN thickness (1.4 nm and 2.4 nm) on positive bias temperature instability (PBTI) of high-k/metal gate nMOSFETs with gate-last process 期刊论文  OAI收割
Chinese Physics B, 2015
作者:  
Qi LW(祁路伟);  Wang WW(王文武)
  |  收藏  |  浏览/下载:9/0  |  提交时间:2016/05/31
Investigation of TiAlC by Atomic Layer Deposition as N Type 期刊论文  OAI收割
ECS Journal of Solid State Science and Technology, 2015
作者:  
Cui HS(崔虎山);  Xiang JJ(项金娟);  Li TT(李亭亭);  Zhang YB(张严波);  Wang XL(王晓磊)
  |  收藏  |  浏览/下载:18/0  |  提交时间:2016/05/31
Influence of multi-deposition multi-annealing on time-dependent dielectric breakdown characteristics of PMOS with high- k /metal gate last process 期刊论文  OAI收割
Chinese Physics B, 2015
作者:  
Wang WW(王文武);  Wang YR(王艳蓉)
  |  收藏  |  浏览/下载:8/0  |  提交时间:2016/05/31
Investigation on the dominant key to achieve superior Ge surface passivation by GeOx based on the ozone oxidation 期刊论文  OAI收割
Applied Surface Science, 2015
作者:  
Wang XL(王晓磊);  Wang WW(王文武)
  |  收藏  |  浏览/下载:12/0  |  提交时间:2016/05/31
Study of (w/z)h production and higgs boson couplings using h -> ww* decays with the atlas detector 期刊论文  iSwitch采集
Journal of high energy physics, 2015, 期号: 8, 页码: 65
作者:  
Aad, G.;  Abbott, B.;  Abdallah, J.;  Abdinov, O.;  Aben, R.
收藏  |  浏览/下载:29/0  |  提交时间:2019/04/23
AN ULTRA-LUMINOUS QUASAR AT z=5.363 WITH A TEN BILLION SOLAR MASS BLACK HOLE AND A METAL-RICH DLA AT z similar to 5 期刊论文  OAI收割
ASTROPHYSICAL JOURNAL LETTERS, 2015, 卷号: 807, 期号: 1
作者:  
Wang, FG;  Wu, XB;  Fan, XH;  Yang, JY;  Cai, Z
收藏  |  浏览/下载:27/0  |  提交时间:2016/04/08
An Investigation of Capacitance-Voltage Hysteresis in Al2O3/SiC MIS Capacitors 期刊论文  OAI收割
Materials Science Forum, 2015
作者:  
Shen HJ(申华军);  Wang YY(王弋宇);  Wang XL(王晓磊);  Wu J(吴佳);  Li CZ(李诚瞻)
  |  收藏  |  浏览/下载:15/0  |  提交时间:2016/05/26
PARTIAL ERUPTION OF A FILAMENT WITH TWISTING NON-UNIFORM FIELDS 期刊论文  OAI收割
ASTROPHYSICAL JOURNAL, 2015, 卷号: 805, 期号: 1
作者:  
Bi Y(毕以);  Jiang YC(姜云春);  Yang JY(杨家艳);  Xiang YY(向永源);  Cai YF(蔡云芳)
收藏  |  浏览/下载:11/0  |  提交时间:2016/04/08
Characterization of positive bias temperature instability of NMOSFET with high-k/metal gate last process 期刊论文  OAI收割
Journal of Semiconductors, 2015
作者:  
Ren SQ(任尚清);  Wang WW(王文武)
  |  收藏  |  浏览/下载:11/0  |  提交时间:2016/05/31