In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation
文献类型：期刊论文
| 作者 | Li P(李鹏) ; Liu LQ(刘连庆); Yang Y(杨洋); Wang YC(王越超); Li GY(李广勇)
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| 刊名 | IEEE Transactions on Industrial Electronics
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| 出版日期 | 2015 |
| 卷号 | 62期号:10页码:6508-6518 |
| 关键词 | Capacitance compensation (CC) in-phase bias modulation (IPBM) mode scanning ion conductance microscopy (SICM) signal-to-noise ratio (SNR) |
| ISSN号 | 0278-0046 |
| 产权排序 | 1 |
| 通讯作者 | 李鹏 |
| 中文摘要 | The in-phase bias modulation (IPBM) mode of scanning ion conductance microscopy (SICM), which has advantages of both the dc mode and the traditional ac mode, is immune to low-frequency external electronic interference and potential drift while maintaining a high scanning speed. However, the IPBM mode still suffers from a low-signal-to-noise ratio (SNR). In this paper, we propose a capacitance compensation (CC) method to solve the problem in the IPBM mode of SICM. After CC, the signal level is significantly increased while the noise level remains unchanged. The increased SNR not only improves the image quality but also allows the system to work at a higher modulation frequency, thus increasing potential for fast scan. Experimental results verify the effectiveness of the IPBM mode of SICM with CC. |
| WOS标题词 | Science & Technology ; Technology |
| 类目[WOS] | Automation & Control Systems ; Engineering, Electrical & Electronic ; Instruments & Instrumentation |
| 研究领域[WOS] | Automation & Control Systems ; Engineering ; Instruments & Instrumentation |
| 关键词[WOS] | ATOMIC-FORCE MICROSCOPY ; LIVING CELLS ; NANOSCALE ; SYSTEM |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000361534100052 |
| 源URL | [http://ir.sia.cn/handle/173321/16972]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 推荐引用方式 GB/T 7714 | Li P,Liu LQ,Yang Y,et al. In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation[J]. IEEE Transactions on Industrial Electronics,2015,62(10):6508-6518. |
| APA | Li P,Liu LQ,Yang Y,Wang YC,&Li GY.(2015).In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation.IEEE Transactions on Industrial Electronics,62(10),6508-6518. |
| MLA | Li P,et al."In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation".IEEE Transactions on Industrial Electronics 62.10(2015):6508-6518. |
入库方式： OAI收割
来源：沈阳自动化研究所
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