中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
High precision size measurement system of industrial profiles section

文献类型:会议论文

作者Zhang YC(张宜弛); Wu Y(吴阳); Zhou XF(周晓锋); Li S(李帅)
出版日期2015
会议名称2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
会议日期June 8-12, 2015
会议地点Shenyang, China
关键词Machine vision Double telecentric lens Section size measurement Subpixel
页码415-419
中文摘要This paper implements a non-contact measurement system based on machine vision for industrial profiles section, which uses double telecentric lens optical system as image acquisition device. The key procedures using double telecentric lens optical system to get cross section image of measured profile are described in details. Based on the profile characteristic of section itself, we applied smooth filtering and automatic threshold binarization algorithm in image preprocessing, and improve the detection accuracy through subpixel edge detection algorithm. Moreover, combined with high precision section edge images, we realized some practical functions such as geometric measurement, fitting, and contrasting with CAD drawings, etc. The proposed system with high speed, high accuracy and easy maintenance can satisfy the requirement of high precision for industrial profiles section size measurement.
收录类别EI ; CPCI(ISTP)
产权排序1
会议录2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
会议录出版者IEEE
会议录出版地Piscataway, NJ, USA
语种英语
ISSN号2379-7711
ISBN号978-1-4799-8730-6
WOS记录号WOS:000380502300080
源URL[http://ir.sia.cn/handle/173321/17350]  
专题沈阳自动化研究所_数字工厂研究室
推荐引用方式
GB/T 7714
Zhang YC,Wu Y,Zhou XF,et al. High precision size measurement system of industrial profiles section[C]. 见:2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER). Shenyang, China. June 8-12, 2015.

入库方式: OAI收割

来源:沈阳自动化研究所

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