Monitoring and fault diagnosis for industrial process
文献类型:会议论文
作者 | Li S(李帅)![]() ![]() ![]() ![]() |
出版日期 | 2015 |
会议名称 | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) |
会议日期 | June 8-12, 2015 |
会议地点 | Shenyang, China |
关键词 | manifold learning contribution analysis monitoring fault diagnosis |
页码 | 1356-1361 |
中文摘要 | Monitoring and fault diagnosis are crucial for industrial process. In this paper, a simple and efficient manifold learning method is used for process monitoring and fault diagnosis. Firstly, local neighbor relationship of process data is used for process modelling, which divides process data into the embedding space and residual space. Then, different statistics and confidence limits are computed, which can be used for monitoring. Finally, the contribution analysis based on manifold learning is used for fault diagnosis. When the fault variables are found, quality control can be introduced to improve production safety and quality stabilization in industrial process. The manifold learning method is applied for one practical foods industrial production process. The experiment results show the feasibility and efficiency of the manifold learning method for monitoring and fault diagnosis. |
收录类别 | EI ; CPCI(ISTP) |
产权排序 | 1 |
会议录 | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
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会议录出版者 | IEEE |
会议录出版地 | Piscataway, NJ, USA |
语种 | 英语 |
ISSN号 | 2379-7711 |
ISBN号 | 978-1-4799-8730-6 |
WOS记录号 | WOS:000380502300248 |
源URL | [http://ir.sia.cn/handle/173321/17353] ![]() |
专题 | 沈阳自动化研究所_数字工厂研究室 |
推荐引用方式 GB/T 7714 | Li S,Zhou XF,Shi HB,et al. Monitoring and fault diagnosis for industrial process[C]. 见:2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER). Shenyang, China. June 8-12, 2015. |
入库方式: OAI收割
来源:沈阳自动化研究所
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