中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Adaptive sampling and sensing approach with mobile sensor networks

文献类型:会议论文

作者Zhang H(张浩); Zhu YL(朱云龙); Tan JD(谈金东)
出版日期2015
会议名称2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
会议日期June 8-12, 2015
会议地点Shenyang, China
页码654-660
中文摘要This paper presents an adaptive sampling and sensing method for mobile sensor networks to reduce the number of measurements and the sampling cost based on compressive sensing. Compressive sensing always uses random measurements, whose information amount cannot be determined previously. The proposed adaptive sampling and sensing approach can find the most informative measurements in unknown environments and reconstruct the original signals. With mobile sensors, measurements are collected sequentially and organically, which give the chance to optimize each of them uniquely. When a mobile sensor is about to collect a new measurement from the surrounding environment, existing information is shared among networked sensors so that each sensor would have a global view of the entire environment. Shared information is analyzed under a sparse domain to infer a model of the environments. The most informative measurements can be determined by optimizing the model. The simulation results demonstrate the effectiveness and the adaptability of the proposed, theoretically-correct algorithm.
收录类别EI ; CPCI(ISTP)
产权排序1
会议录2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
会议录出版者IEEE
会议录出版地Piscataway, NJ, USA
语种英语
ISSN号2379-7711
ISBN号978-1-4799-8730-6
WOS记录号WOS:000380502300125
源URL[http://ir.sia.cn/handle/173321/17371]  
专题沈阳自动化研究所_信息服务与智能控制技术研究室
推荐引用方式
GB/T 7714
Zhang H,Zhu YL,Tan JD. Adaptive sampling and sensing approach with mobile sensor networks[C]. 见:2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER). Shenyang, China. June 8-12, 2015.

入库方式: OAI收割

来源:沈阳自动化研究所

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