Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses
文献类型：期刊论文
| 作者 | Jiang, H; He, Y; He, YM; Li, AG; Wang, H; Zheng, Y; Dong, ZH |
| 刊名 | JOURNAL OF SYNCHROTRON RADIATION
 |
| 出版日期 | 2015 |
| 卷号 | 22页码:1379—1385 |
| 关键词 | COHERENT SYNCHROTRON-RADIATION X-RAY TOTAL-REFLECTION SCATTERING OPTICS |
| ISSN号 | 1600-5775 |
| 通讯作者 | Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China. |
| 英文摘要 | Ru/C multilayer monochromators with different periodic thicknesses were investigated using X-ray grazing-incidence reflectivity, diffuse scattering, Bragg imaging, morphology testing, etc. before and after cryogenic cooling. Quantitative analyses enabled the determination of the key multilayer structural parameters for samples with different periodic thicknesses, especially the influence from the ruthenium crystallization. The results also reveal that the basic structures and reflection performance keep stable after cryogenic cooling. The low-temperature treatment smoothed the surfaces and interfaces and changed the growth characteristic to a low-frequency surface figure. This study helps with the understanding of the structure evolution of multilayer monochromators during cryogenic cooling and presents sufficient experimental proof for using cryogenically cooled multilayer monochromators in a high-thermal-load undulator beamline. |
| 语种 | 英语 |
| WOS记录号 | WOS:000364422100008 |
| 公开日期 | 2016-03-08 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/25050]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 推荐引用方式 GB/T 7714 | Jiang, H,He, Y,He, YM,et al. Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses[J]. JOURNAL OF SYNCHROTRON RADIATION,2015,22:1379—1385. |
| APA | Jiang, H.,He, Y.,He, YM.,Li, AG.,Wang, H.,...&Dong, ZH.(2015).Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses.JOURNAL OF SYNCHROTRON RADIATION,22,1379—1385. |
| MLA | Jiang, H,et al."Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses".JOURNAL OF SYNCHROTRON RADIATION 22(2015):1379—1385. |
入库方式： OAI收割
来源：上海应用物理研究所
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