Noise analysis of a CDS circuit with offset canceling
文献类型：会议论文
| 作者 | Wang X(王霄); Shi ZL(史泽林) ; Xu BS(徐保树)
|
| 出版日期 | 2015 |
| 会议名称 | 11th IEEE International Conference on Advanced Semiconductor Integrated Circuits (ASIC), ASICON 2015 |
| 会议日期 | November 3-6, 2015 |
| 会议地点 | Chengdu, China |
| 关键词 | Correlated double sampler(CDS) noise model time domain simulation(TDS) power spectrum density(PSD) |
| 页码 | 1-4 |
| 中文摘要 | Correlated double samplers(CDS) are widely used in infrared imaging systems which can suppress 1/f noise effectively. Since the concept was raised, many types of CDS have been constructed whose advantages are different in tradeoff among layout area, speed and power dissipation. This paper presents a method of noise analysis for a CDS that has the function of offset canceling, which starts from the transient noise behavior due to noise models in each clock phase. Then based on the theory of stationary random process, power spectrum density(PSD) of output noise is derived. At last a time domain simulation(TDS) is applied to verify the feasibility of the noise analysis method we proposed, which corresponds well. The proposed method provides a noise estimation method of the CDS through which we can deduce contributions from each noise source to the output noise, moreover whose simulation time is much shorter than that of a TDS. |
| 收录类别 | EI |
| 产权排序 | 1 |
| 会议主办者 | Fudan University; IEEE Beijing Section |
| 会议录 | Proceedings - 2015 IEEE 11th International Conference on ASIC, ASICON 2015
 |
| 会议录出版者 | IEEE |
| 会议录出版地 | Piscataway, NJ, USA |
| 语种 | 英语 |
| ISBN号 | 978-1-4799-8483-1 |
| 源URL | [http://ir.sia.cn/handle/173321/18845]  |
| 专题 | 沈阳自动化研究所_光电信息技术研究室 |
| 推荐引用方式 GB/T 7714 | Wang X,Shi ZL,Xu BS. Noise analysis of a CDS circuit with offset canceling[C]. 见:11th IEEE International Conference on Advanced Semiconductor Integrated Circuits (ASIC), ASICON 2015. Chengdu, China. November 3-6, 2015. |
入库方式： OAI收割
来源：沈阳自动化研究所
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