Joint Geometric and Photometric Direct Image Registration Based on Lie Algebra Parameterization
文献类型：会议论文
| 作者 | Li CX(李晨曦); Shi ZL(史泽林) ; Liu YP(刘云鹏)
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| 出版日期 | 2016 |
| 会议名称 | International Symposium on Infrared Technology and Application and the International Symposiums on Robot Sensing and Advanced Control |
| 会议日期 | May 9-11, 2016 |
| 会议地点 | Beijing |
| 关键词 | Image registration lighting changes Lie algebra efficient second-order minimization Lie group |
| 页码 | 1-7 |
| 通讯作者 | 李晨曦 |
| 中文摘要 | In this paper, we consider direct image registration problem which estimate the geometric and photometric transformations between two images. The efficient second-order minimization method (ESM) is based on a second-order Taylor series of image differences without computing the Hessian under brightness constancy assumption. This can be done due to the fact that the considered geometric transformations is Lie group and can be parameterized by its Lie algebra. In order to deal with lighting changes, we extend ESM to the compositional dual efficient second-order minimization method (CDESM). In our approach, the photometric transformations is parameterized by its Lie algebra with compositional operation, which is similar to that of geometric transformations. Our algorithm can give a second-order approximation of image differences with respect to geometric and photometric parameters. The geometric and photometric parameters are simultaneously obtained by non-linear least-square optimization. Our algorithm preserves the advantages of the original ESM method which has high convergence rate and large capture radius. Experimental results show that our algorithm is more robust to lighting changes and has higher registration accuracy compared to previous algorithms. |
| 收录类别 | EI ; CPCI（ISTP） |
| 产权排序 | 1 |
| 会议录 | Proceedings of SPIE - The International Society for Optical Engineering
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| 会议录出版者 | SPIE |
| 会议录出版地 | Bellingham, WA |
| 语种 | 英语 |
| ISSN号 | 0277-786X |
| ISBN号 | 978-1-5106-0772-9 |
| WOS记录号 | WOS:000391228600068 |
| 源URL | [http://ir.sia.cn/handle/173321/19481]  |
| 专题 | 沈阳自动化研究所_光电信息技术研究室 |
| 推荐引用方式 GB/T 7714 | Li CX,Shi ZL,Liu YP. Joint Geometric and Photometric Direct Image Registration Based on Lie Algebra Parameterization[C]. 见:International Symposium on Infrared Technology and Application and the International Symposiums on Robot Sensing and Advanced Control. Beijing. May 9-11, 2016. |
入库方式： OAI收割
来源：沈阳自动化研究所
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