中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Joint Geometric and Photometric Direct Image Registration Based on Lie Algebra Parameterization

文献类型:会议论文

作者Li CX(李晨曦); Shi ZL(史泽林); Liu YP(刘云鹏)
出版日期2016
会议名称International Symposium on Infrared Technology and Application and the International Symposiums on Robot Sensing and Advanced Control
会议日期May 9-11, 2016
会议地点Beijing
关键词Image registration lighting changes Lie algebra efficient second-order minimization Lie group
页码1-7
通讯作者李晨曦
中文摘要In this paper, we consider direct image registration problem which estimate the geometric and photometric transformations between two images. The efficient second-order minimization method (ESM) is based on a second-order Taylor series of image differences without computing the Hessian under brightness constancy assumption. This can be done due to the fact that the considered geometric transformations is Lie group and can be parameterized by its Lie algebra. In order to deal with lighting changes, we extend ESM to the compositional dual efficient second-order minimization method (CDESM). In our approach, the photometric transformations is parameterized by its Lie algebra with compositional operation, which is similar to that of geometric transformations. Our algorithm can give a second-order approximation of image differences with respect to geometric and photometric parameters. The geometric and photometric parameters are simultaneously obtained by non-linear least-square optimization. Our algorithm preserves the advantages of the original ESM method which has high convergence rate and large capture radius. Experimental results show that our algorithm is more robust to lighting changes and has higher registration accuracy compared to previous algorithms.
收录类别EI ; CPCI(ISTP)
产权排序1
会议录Proceedings of SPIE - The International Society for Optical Engineering
会议录出版者SPIE
会议录出版地Bellingham, WA
语种英语
ISSN号0277-786X
ISBN号978-1-5106-0772-9
WOS记录号WOS:000391228600068
源URL[http://ir.sia.cn/handle/173321/19481]  
专题沈阳自动化研究所_光电信息技术研究室
推荐引用方式
GB/T 7714
Li CX,Shi ZL,Liu YP. Joint Geometric and Photometric Direct Image Registration Based on Lie Algebra Parameterization[C]. 见:International Symposium on Infrared Technology and Application and the International Symposiums on Robot Sensing and Advanced Control. Beijing. May 9-11, 2016.

入库方式: OAI收割

来源:沈阳自动化研究所

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