中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Control Chart Patterns Recognition based on DAG-SVM

文献类型:会议论文

作者Xiao ZB(肖忠保); Chen SH(陈书宏)
出版日期2015
会议名称6th International Conference on Manufacturing Science and Engineering (ICMSE)
会议日期November 28-29, 2015
会议地点Guangzhou, PEOPLES R CHINA
关键词DAG SVM PSO
页码1056-1062
中文摘要Statistical process control charts have been widely utilized in manufacturing processes for determining whether a process is run in its intended mode or in the presence of unnatural patterns, it's a multi-class classifier problem. Effective approaches to recognize control chart patterns is essential for a manufacturing process to maintain high-quality products. This paper we use the Directed Acyclic Graph(DAG) tree learning architecture, which combines many two-class classifiers together to solve the multi-class classifier problem. For each node we chose the support vector machine(SVM) using a particle swarm optimization(PSO) algorithm to optimize the parameter of the SVM kernel function. Here the PSO not only takes the kernel function parameters as variables but also the feature vector of the SVM to optimize. Simulation results show the propose algorithm achieves a high recognition accuracy and solve the unable recognition area.
收录类别CPCI(ISTP)
产权排序1
会议录PROCEEDINGS OF THE 2015 6TH INTERNATIONAL CONFERENCE ON MANUFACTURING SCIENCE AND ENGINEERING
会议录出版者ATLANTIS PRESS
会议录出版地PARIS
语种英语
ISSN号2352-5401
ISBN号978-94-6252-137-7
WOS记录号WOS:000388457800193
源URL[http://ir.sia.cn/handle/173321/19490]  
专题沈阳自动化研究所_智能检测与装备研究室
推荐引用方式
GB/T 7714
Xiao ZB,Chen SH. Control Chart Patterns Recognition based on DAG-SVM[C]. 见:6th International Conference on Manufacturing Science and Engineering (ICMSE). Guangzhou, PEOPLES R CHINA. November 28-29, 2015.

入库方式: OAI收割

来源:沈阳自动化研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。