Local Scan for Compensation of Drift Contamination in AFM Based Nanomanipulation
文献类型：会议论文
| 作者 | Wang, Yucai; Li GY(李广勇) ; Liu LQ(刘连庆)
|
| 出版日期 | 2009 |
| 会议名称 | 2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009) |
| 会议日期 | October 10-15, 2009 |
| 会议地点 | St Louis, MO, USA |
| 关键词 | Nanomanipulation Atomic Force microscope Drift Compensation |
| 页码 | 1345-1350 |
| 通讯作者 | Wang, Yucai |
| 中文摘要 | Because of the presence of thermal drift, AFM (atomic force microscopy) images are always contaminated. Such contamination is one of the major hampers to achieve accurate and efficient AFM based nanomanipulation. Based on contaminated images, the manipulation operations often fail. In this paper, we apply a local scan method to identify and compensate the thermal drift contamination in the AFM image. After an AFM image is captured, the entire image is divided into several parts along y direction. A local scan is immediately performed in each part of the image to calculate the drift value at that very part. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, which lead to improved accuracy for AFM imaging and enhanced productivity for AFM based nanomanipulation. |
| 收录类别 | EI ; CPCI（ISTP） |
| 产权排序 | 2 |
| 会议主办者 | IEEE Robot & Automat Soc (RA), Robot Soc Japan (RSJ), Soc Instruments & Control Engn, IEEE Ind Elect Soc, Inst Control, Robot & Syst Korea, ABB, Barrett Technol, Inc, Willow Garage, ROBOTIS, Aldebaran Robot |
| 会议录 | 2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009)
 |
| 会议录出版者 | IEEE Computer Society |
| 会议录出版地 | Piscataway, NJ, USA |
| 语种 | 英语 |
| ISBN号 | 978-1-4244-3803-7 |
| WOS记录号 | WOS:000285372900224 |
| 源URL | [http://ir.sia.cn/handle/173321/19870]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 推荐引用方式 GB/T 7714 | Wang, Yucai,Li GY,Liu LQ. Local Scan for Compensation of Drift Contamination in AFM Based Nanomanipulation[C]. 见:2009 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2009). St Louis, MO, USA. October 10-15, 2009. |
入库方式： OAI收割
来源：沈阳自动化研究所
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