中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Kwong-Li probes: Novel nano-probes for biological dissection and injection

文献类型:会议论文

作者Kwong, C.C.H.; Lai, K.W.C.; Yan, Ruiguang; Li WJ(李文荣)
出版日期2003
会议名称2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2003
会议日期July 20-24, 2003
会议地点Kobe, Japan
关键词Sacrificial Boundary Etching SNOM Tips Nan0 Tips Kwong-Li Probes Kowng-Li Method
页码897-901
通讯作者李文荣
中文摘要We recently discovered a very fast and reliable single-step etching process to fabricate tiny-angled (<2.7°) fiber probe tips, which is less complex and yields finer tips than other available multiple-step sharp-tip (e.g., SNOM tips) fabrication processes. The process is named as Kwong-Li's (KL) Method. As the probe profile depends highly on the interfacial meniscus of the etchant, by means of our sacrificial boundary etching technique, in which we introduced glass tubing as etching barriers, probes with very sharp tips and long tapers were formed. Using p-xylene as organic solvent and hydrofluoric acid as etchant, we succeeded in shaping optical fibers (with initial fiber diameter of 125 μm) into sharp tips with angles ranging front <2.7-9.7°, with nanoscale tip diameter of <1μm. By adjusting the initial etchant height in the tubing, final tip angles can be controlled. With their nanometric tips, these sharp probes will be useful for various scanning probe microscopy applications and could potentially be used as surgical tools for micro cellular surgery, i.e., we have already shown that KL probes will penetrate through cell membranes with less mechanical resistance than conventional pipettes and probes made by Turner's Method. The fabrication process of KL probes and experimental results from using KL probes to probe cells are presented in this paper.
收录类别EI ; CPCI(ISTP)
产权排序2
会议主办者ASME Dynamic Systems and Control Division (DSC); IEEE Industrial Electronics Society (IES); IEEE Robotics and Automation Society (RAS)
会议录IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM
会议录出版者Institute of Electrical and Electronics Engineers Inc.
语种英语
ISBN号0-7803-7759-1
WOS记录号WOS:000185624100151
源URL[http://ir.sia.cn/handle/173321/19999]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Kwong, C.C.H.,Lai, K.W.C.,Yan, Ruiguang,et al. Kwong-Li probes: Novel nano-probes for biological dissection and injection[C]. 见:2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2003. Kobe, Japan. July 20-24, 2003.

入库方式: OAI收割

来源:沈阳自动化研究所

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