中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Hardness determination at nanoscale by ultrasonic vibration-assisted AFM

文献类型:会议论文

作者Shi JL(施佳林); Yu P(于鹏); Liu LQ(刘连庆); Cong Y(丛杨)
出版日期2017
会议名称1st International Conference on Manipulation, Automation and Robotics at Small Scales, MARSS 2017
会议日期July 17-21, 2017
会议地点Montreal, Canada
关键词atomic force microscopy nanomachining thin film mechanical properties
页码1-5
通讯作者Liu LQ(刘连庆)
中文摘要Mechanical properties at nanoscale are crucial fators in the applications such as nanoscale interconnects and active components in electronic, optoelectronic, and electromechanical devices. Determination of the hardness of nanostructures, especially nano-thin-film, with regime from several to hundreds nanometers is a challenge. In this study, we proposed an ultrasonic vibration (USV)-assisted atomic force microscopy (AFM) method to measure the hardness of bulk materials and nano-thin-film with the thickness of 25 and hundreds nanometers. The hardness properties of material can be detected by the cantilever phase response in the USV machining process. By recording the depth-phase data, the hardness information can be extracted through fitting the data by the mathematical model. The theoretical analysis and experimental results valid the proposed method.
收录类别EI
产权排序1
会议录International Conference on Manipulation, Automation and Robotics at Small Scales, MARSS 2017 - Proceedings
会议录出版者IEEE
会议录出版地New York
语种英语
ISBN号978-1-5386-0346-8
源URL[http://ir.sia.cn/handle/173321/21073]  
专题沈阳自动化研究所_机器人学研究室
作者单位1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China
2.University of Chinese Academy of Sciences, Beijing, 100049, China
推荐引用方式
GB/T 7714
Shi JL,Yu P,Liu LQ,et al. Hardness determination at nanoscale by ultrasonic vibration-assisted AFM[C]. 见:1st International Conference on Manipulation, Automation and Robotics at Small Scales, MARSS 2017. Montreal, Canada. July 17-21, 2017.

入库方式: OAI收割

来源:沈阳自动化研究所

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