Fault analysis and fault diagnosis method review on active distribution network
文献类型：会议论文
| 作者 | Yu HB(于海斌) ; Sun LX(孙兰香); Liu, Jianchang; Zhang, Tong
|
| 出版日期 | 2017 |
| 会议名称 | 2nd International Conference on Intelligent and Interactive Systems and Applications, IISA 2017 |
| 会议日期 | June 17-18, 2017 |
| 会议地点 | Beijing, China |
| 关键词 | Active distribution network (ADN) Fault analysis Fault diagnosis |
| 页码 | 628-633 |
| 通讯作者 | Zhang, Tong |
| 中文摘要 | This paper analyses the current situation and researches the fault cause and the common fault type in active distribution network (ADN). The fault diagnosis methods are summarized and the advantage of the common methods are compared. The general problems consist in the current fault diagnosis methods of ADN are researched in this paper. Combining the development trend of ADN and the power supply reliability demand, the further research direction of ADN fault diagnosis method is proposed, which lays the foundation of the AND self healing and protection control. |
| 收录类别 | EI |
| 产权排序 | 2 |
| 会议录 | Advances in Intelligent Systems and Computing
 |
| 会议录出版者 | Springer Verlag |
| 会议录出版地 | Berlin |
| 语种 | 英语 |
| ISSN号 | 2194-5357 |
| ISBN号 | 978-3-319-69095-7 |
| 源URL | [http://ir.sia.cn/handle/173321/21234]  |
| 专题 | 沈阳自动化研究所_工业控制网络与系统研究室 |
| 作者单位 | 1.Key Laboratory of Industrial Control Network, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China 2.Department of Automation, College of Information Science and Engineering, Northeastern University, Shenyang, 110819, China |
| 推荐引用方式 GB/T 7714 | Yu HB,Sun LX,Liu, Jianchang,et al. Fault analysis and fault diagnosis method review on active distribution network[C]. 见:2nd International Conference on Intelligent and Interactive Systems and Applications, IISA 2017. Beijing, China. June 17-18, 2017. |
入库方式： OAI收割
来源：沈阳自动化研究所
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