中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effective Validation of the Semi-physical Test Bench for Sun Orientation

文献类型:会议论文

作者Zhang X(张啸); Xu ZG(徐志刚); He Y(贺云); Yin M(尹猛); Zhang, Shixuan
出版日期2017
会议名称7th Annual IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (IEEE-CYBER 2017)
会议日期July 31 - August 4, 2017
会议地点Hawaii, USA
关键词Effective Validation the Semi-physical Test Bench Sun Orientation
页码1-6
通讯作者He Y(贺云)
中文摘要In this paper, a new method is presented to test the loading effectiveness of the semi-physical test system based on the torsional vibration system, which is on behalf of the ground test equipment driven by solar panels. The dynamic model of the torsional vibration system is established, and the rationality of the scheme is verified through simulation analysis; by comparing the loading torque curve of the dynamic model with the curve generated by the physical object, the effectiveness of the semi-physical test bench is validated. The experimental result shows the semi-physical test bench has high loading precision and meets the requirements of experiments. By evaluation on the equivalent dynamic model with known characteristics, the characteristics of the test bench become clear, so this method has a certain reference value for performance test of other semi-physical test equipment.
产权排序1
会议录7th Annual IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (IEEE-CYBER 2017)
会议录出版者IEEE
会议录出版地New York
语种英语
ISBN号978-1-5386-0489-2
源URL[http://ir.sia.cn/handle/173321/21286]  
专题沈阳自动化研究所_装备制造技术研究室
作者单位1.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Zhang X,Xu ZG,He Y,et al. Effective Validation of the Semi-physical Test Bench for Sun Orientation[C]. 见:7th Annual IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (IEEE-CYBER 2017). Hawaii, USA. July 31 - August 4, 2017.

入库方式: OAI收割

来源:沈阳自动化研究所

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