A contour extraction algorithm based on wavelet transform and dynamic contour compensation
文献类型：会议论文
| 作者 | Mu BY(穆宝岩) ; Ma Y(马钺); Chen S(陈帅)
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| 出版日期 | 2016 |
| 会议名称 | 2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS) |
| 会议日期 | December 2-4, 2016 |
| 会议地点 | Xi'an, CHINA |
| 关键词 | Edge Detection Wavelet Transform Contour Compensation |
| 页码 | 109-115 |
| 通讯作者 | Mu BY(穆宝岩) |
| 中文摘要 | Contour extraction process is often disturbed by complex backgrounds or foregrounds in the machine vision system. A new contour extraction algorithm is proposed based on wavelet transform and dynamic contour compensation. The wavelet transform method is used to extract the edge of image, and the dynamic compensation is used to restore the contour which is affected by the complex dark areas such as bar code or black icon. The algorithm is applied in a sausage machine vision inspection system, and it is proved effective in eliminating the contour depression and retaining the actual defect features. |
| 收录类别 | CPCI（ISTP） |
| 产权排序 | 1 |
| 会议录 | PROCEEDINGS OF THE 2ND ANNUAL INTERNATIONAL CONFERENCE ON ELECTRONICS, ELECTRICAL ENGINEERING AND INFORMATION SCIENCE (EEEIS 2016)
 |
| 会议录出版者 | ATLANTIS PRESS |
| 会议录出版地 | PARIS |
| 语种 | 英语 |
| ISSN号 | 2352-5401 |
| ISBN号 | 978-94-6252-320-3 |
| WOS记录号 | WOS:000400862900014 |
| 源URL | [http://ir.sia.cn/handle/173321/20491]  |
| 专题 | 沈阳自动化研究所_智能检测与装备研究室 |
| 作者单位 | Shenyang Institute of Automation Chinese Academy of Sciences, Shenyang, Liaoning, China |
| 推荐引用方式 GB/T 7714 | Mu BY,Ma Y,Chen S. A contour extraction algorithm based on wavelet transform and dynamic contour compensation[C]. 见:2nd Annual International Conference on Electronics, Electrical Engineering and Information Science (EEEIS). Xi'an, CHINA. December 2-4, 2016. |
入库方式： OAI收割
来源：沈阳自动化研究所
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