中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Monitoring based on MIC-PCA and SVDD for industrial process

文献类型:会议论文

作者Zhou XF(周晓锋); Song H(宋宏); Li S(李帅); Wang ZW(王中伟)
出版日期2017
会议名称2nd IEEE Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2017
会议日期March 25-26, 2017
会议地点Chongqing, China
关键词principal component analysis support vector data description maximal information coefficient process monitoring industrial process
页码1210-1214
通讯作者Wang ZW(王中伟)
中文摘要Complex industrial processes are often non-linear and non-Gaussian, while the traditional principal component analysis (PCA) method assumes that the data are Gaussian and linear. In this paper, a novel process monitoring method based on maximum information coefficient-PCA (MIC-PCA) and support vector data description (SVDD) is proposed. First, the covariance matrix is replaced by the MIC matrix which can measure the non-linear correlation between the variables. Then the SVDD models are built in the principal component subspace (PCS) and the residual subspace (RS) to improve the monitoring of non-linear and non-Gaussian processes. Finally, the feasibility and effectiveness of the proposed method are validated by high-pressure and low-density polyethylene (LDPE) industrial process.
收录类别EI ; CPCI(ISTP)
产权排序1
会议主办者Chongqing Geeks Education Technology Co., Ltd; Chongqing Global Union Academy of Science and Technology; Global Union Academy of Science and Technology; IEEE Beijing Section
会议录Proceedings of 2017 IEEE 2nd Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2017
会议录出版者IEEE
会议录出版地New York
语种英语
ISBN号978-1-4673-8977-8
WOS记录号WOS:000427137300243
源URL[http://ir.sia.cn/handle/173321/21245]  
专题沈阳自动化研究所_数字工厂研究室
作者单位1.University of Chinese Academy of Sciences, Beijing, China
2.Key Laboratory of Network Control System, Chinese Academy of Sciences, Shenyang, China
3.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
推荐引用方式
GB/T 7714
Zhou XF,Song H,Li S,et al. Monitoring based on MIC-PCA and SVDD for industrial process[C]. 见:2nd IEEE Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2017. Chongqing, China. March 25-26, 2017.

入库方式: OAI收割

来源:沈阳自动化研究所

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