中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Multivariate Mean Shift Diagnostic Model Based on Support Vector Machine

文献类型:会议论文

作者Cai YJ(蔡亚军)1,2; Wang Y(王宇)1; Chen SH(陈书宏)1
出版日期2017
会议日期July 31 - August 4, 2017
会议地点Hawaii, USA
关键词Quality Monitoring Quality Characteristics Principal Component Analysis(Pca) Support Vector Machine(Svm) Modified Grid Algorithm
页码713-718
英文摘要

Quality monitoring can effectively improve product quality and production efficiency. In the production process of complex products, the interaction of multiple quality characteristics affects the quality of production jointly. The large number of quality characteristics and coupled relationship of some characteristics enhance the difficulty of accurate diagnosis of abnormal variables. In order to diagnose the abnormal variables accurately and improve product quality and production efficiency, this paper proposes a model of monitoring the mean shift based on the improved grid optimization principal component analysis(PCA)-support vector machines(SVM). Before training the model, principal component analysis(PCA) algorithm is used to process the data to reduce data dimension and extract data feature information. Then, this paper uses the modified grid algorithm to optimize the parameters of support vector machine (SVM). Finally, the optimized SVM model is attained. The simulation results show that the proposed method has better performance than the traditional methods.

源文献作者IEEE Robotics and Automation Society
产权排序1
会议录2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
会议录出版者IEEE
会议录出版地New York
语种英语
ISBN号978-1-5386-0489-2
WOS记录号WOS:000447628700129
源URL[http://ir.sia.cn/handle/173321/22824]  
专题沈阳自动化研究所_智能检测与装备研究室
通讯作者Cai YJ(蔡亚军)
作者单位1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Cai YJ,Wang Y,Chen SH. Multivariate Mean Shift Diagnostic Model Based on Support Vector Machine[C]. 见:. Hawaii, USA. July 31 - August 4, 2017.

入库方式: OAI收割

来源:沈阳自动化研究所

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