A new image denoising method based on wavelet multi-scale registration fusion
文献类型:会议论文
作者 | Ma Y(马钺)![]() ![]() ![]() ![]() |
出版日期 | 2018 |
会议日期 | July 13-15, 2018 |
会议地点 | Shenzhen, China |
关键词 | image denoising wavelet transform wavelet multi-scale registration fusion improved wavelet threshold shrink |
页码 | 55-60 |
英文摘要 | Image denoising is an eternal research topic. In this paper, a new image denoising method based on wavelet multiscale registration fusion is proposed to solve the problem that it is easy to lose the edge and texture details of the image in the denoising process. First of all, we can get multiple sets of wavelet coefficients by using different wavelet bases to decompose the same noisy image. Then, the obtained wavelet coefficients are processed by the improved wavelet threshold shrink to get multiple denoising images of the same noisy image. At last, we use the fusion registration algorithm proposed in this paper to fuse the edge feature of multiple denoising images to get the final denoising image. The experiments prove that this method not only can effectively overcome the pseudo gibbs phenomenon caused by the hard threshold method, but also can overcome the image distortion phenomenon caused by the soft threshold method. More importantly, compared with existing methods, this method can effectively preserve the edge detail and texture features of the image and the image has a better visual effect after fusion registration. Therefore, it has a better application value. |
源文献作者 | IEEE |
产权排序 | 1 |
会议录 | 2018 IEEE 3rd International Conference on Signal and Image Processing, ICSIP 2018
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会议录出版者 | IEEE |
会议录出版地 | New York |
语种 | 英语 |
ISBN号 | 978-1-5386-6394-3 |
WOS记录号 | WOS:000464883600011 |
源URL | [http://ir.sia.cn/handle/173321/24234] ![]() |
专题 | 沈阳自动化研究所_智能检测与装备研究室 |
通讯作者 | Gao L(高亮) |
作者单位 | Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China |
推荐引用方式 GB/T 7714 | Ma Y,Gao L,Wu, Jing Hui,et al. A new image denoising method based on wavelet multi-scale registration fusion[C]. 见:. Shenzhen, China. July 13-15, 2018. |
入库方式: OAI收割
来源:沈阳自动化研究所
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