中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
An improvement on si-etching tetramethyl ammonium hydroxide solution

文献类型:期刊论文

作者Yang, D; Yu, JZ; Chen, SW; Fan, ZC; Li, YT
刊名Chinese journal of chemical engineering
出版日期2005-02-01
卷号13期号:1页码:48-50
关键词Silicon Silicon dioxide Tetramethyl ammonium hydroxide Etching rate
ISSN号1004-9541
通讯作者Yu, jz()
英文摘要An optimal concentration of the etching solution for deep etching of silicon, including 3% tetramethyl ammonium hydroxide and 0.3% (nh4)(2)s2o8, was achieved in this paper. for this etching solution, the etching rates of silicon and silicon dioxide were about 1.1 mu m(.)min(-1) and 0.5 nm(.)min(-1), respectively. the etching ratio between (100) and (111) planes was about 34:1, and the etched surface was very smooth.
WOS关键词SILICON
WOS研究方向Engineering
WOS类目Engineering, Chemical
语种英语
WOS记录号WOS:000227861600009
出版者CHEMICAL INDUSTRY PRESS
URI标识http://www.irgrid.ac.cn/handle/1471x/2426324
专题半导体研究所
通讯作者Yu, JZ
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Yang, D,Yu, JZ,Chen, SW,et al. An improvement on si-etching tetramethyl ammonium hydroxide solution[J]. Chinese journal of chemical engineering,2005,13(1):48-50.
APA Yang, D,Yu, JZ,Chen, SW,Fan, ZC,&Li, YT.(2005).An improvement on si-etching tetramethyl ammonium hydroxide solution.Chinese journal of chemical engineering,13(1),48-50.
MLA Yang, D,et al."An improvement on si-etching tetramethyl ammonium hydroxide solution".Chinese journal of chemical engineering 13.1(2005):48-50.

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来源:半导体研究所

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