中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Photovoltaic effects in ingan structures with p-n junctions

文献类型:期刊论文

作者Yang, Cuibai; Wang, Xiaoliang; Xiao, Hongling; Ran, Junxue; Wang, Cuimei; Hu, Guoxin; Wang, Xinhua; Zhang, Xiaobin; Li, Manping; Li, Jinmin
刊名Physica status solidi a-applications and materials science
出版日期2007-12-01
卷号204期号:12页码:4288-4291
ISSN号1862-6300
通讯作者Yang, cuibai(cbyang@semi.ac.en)
英文摘要Ingan photovoltaic structures with p-n junctions have been fabricated by metal organic chemical vapour deposition. using double-crystal x-ray diffraction measurements, it was found that the room temperature band gaps of p-ingan and n-ingan films were 2.7 and 2.8 ev, respectively. values of 3.4 x 10(-2) ma cm(-2) short-circuit current, 0.43 v open-circuit voltage and 0.57 fill factor have been achieved under ultraviolet illumination (360 nm), which were related to p-n junction connected back-to-back with a schottky barrier and many defects of the p-ingan film. 2007 wiley-vch verlag gmbh & co. kgaa, weinheim.
WOS关键词FUNDAMENTAL-BAND GAP ; IN1-XGAXN ALLOYS ; INN
WOS研究方向Materials Science ; Physics
WOS类目Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
语种英语
出版者WILEY-BLACKWELL
WOS记录号WOS:000252309600079
URI标识http://www.irgrid.ac.cn/handle/1471x/2427105
专题半导体研究所
通讯作者Yang, Cuibai
作者单位Chinese Acad Sci, Inst Semicond, Novel Semicond Mat Lab, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Yang, Cuibai,Wang, Xiaoliang,Xiao, Hongling,et al. Photovoltaic effects in ingan structures with p-n junctions[J]. Physica status solidi a-applications and materials science,2007,204(12):4288-4291.
APA Yang, Cuibai.,Wang, Xiaoliang.,Xiao, Hongling.,Ran, Junxue.,Wang, Cuimei.,...&Li, Jinmin.(2007).Photovoltaic effects in ingan structures with p-n junctions.Physica status solidi a-applications and materials science,204(12),4288-4291.
MLA Yang, Cuibai,et al."Photovoltaic effects in ingan structures with p-n junctions".Physica status solidi a-applications and materials science 204.12(2007):4288-4291.

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来源:半导体研究所

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