中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effects of the sputtering time of zno buffer layer on the quality of gan thin films

文献类型:期刊论文

作者Xue, Shoubin1; Zhang, Xing1; Huang, Ru1; Zhuang, Huizhao2
刊名Applied surface science
出版日期2008-08-30
卷号254期号:21页码:6766-6769
关键词Gan films Zno buffer layers Sputtering time
ISSN号0169-4332
DOI10.1016/j.apsusc.2008.04.083
通讯作者Xue, shoubin(xueshoubin-pku@163.com)
英文摘要Zno thin films with different thickness (the sputtering time of zno buffer layers was 10 min, 15 min, 20 min, and 25 min, respectively) were first prepared on si substrates using radio frequency magnetron sputtering system and then the samples were annealed at 900 degrees c in oxygen ambient. subsequently, a gan epilayer about 500 nm thick was deposited on zno buffer layer. the gan/zno films were annealed in nh(3) ambient at 950 degrees c. x-ray diffraction (xrd), atom force microscopy (afm), x-ray photoelectron spectroscopy (xps) and photoluminescence (pl) were used to analyze the structure, morphology, composition and optical properties of gan films. the results show that their properties are investigated particularly as a function of the sputtering time of zno layers. for the better growth of gan films, the optimal sputtering time is 15 min. (c) 2008 elsevier b. v. all rights reserved.
WOS关键词CHEMICAL-VAPOR-DEPOSITION ; TIN OXIDE-FILMS ; NITRIDE ; GROWTH ; TEMPERATURE ; DIODES
WOS研究方向Chemistry ; Materials Science ; Physics
WOS类目Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
语种英语
WOS记录号WOS:000258997700013
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2427490
专题半导体研究所
通讯作者Xue, Shoubin
作者单位1.Peking Univ, Inst Microelect, SOI Grp, Beijing 100871, Peoples R China
2.Shandong Normal Univ, Inst Semicond, Jinan 250014, Peoples R China
推荐引用方式
GB/T 7714
Xue, Shoubin,Zhang, Xing,Huang, Ru,et al. Effects of the sputtering time of zno buffer layer on the quality of gan thin films[J]. Applied surface science,2008,254(21):6766-6769.
APA Xue, Shoubin,Zhang, Xing,Huang, Ru,&Zhuang, Huizhao.(2008).Effects of the sputtering time of zno buffer layer on the quality of gan thin films.Applied surface science,254(21),6766-6769.
MLA Xue, Shoubin,et al."Effects of the sputtering time of zno buffer layer on the quality of gan thin films".Applied surface science 254.21(2008):6766-6769.

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来源:半导体研究所

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