Measurement of polar c-plane and nonpolar a-plane inn/zno heterojunctions band offsets by x-ray photoelectron spectroscopy
文献类型:期刊论文
作者 | Yang, A. L.; Song, H. P.; Wei, H. Y.; Liu, X. L.; Wang, J.; Lv, X. Q.; Jin, P.; Yang, S. Y.; Zhu, Q. S.; Wang, Z. G. |
刊名 | Applied physics letters
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出版日期 | 2009-04-20 |
卷号 | 94期号:16页码:3 |
关键词 | Conduction bands Iii-v semiconductors Ii-vi semiconductors Indium compounds Interface states Polarisation Semiconductor heterojunctions Valence bands Wide band gap semiconductors X-ray photoelectron spectra Zinc compounds |
ISSN号 | 0003-6951 |
DOI | 10.1063/1.3123814 |
通讯作者 | Yang, a. l.(alyang@semi.ac.cn) |
英文摘要 | The valence band offsets of the wurtzite polar c-plane and nonpolar a-plane inn/zno heterojunctions are directly determined by x-ray photoelectron spectroscopy to be 1.76 +/- 0.2 ev and 2.20 +/- 0.2 ev. the heterojunctions form in the type-i straddling configuration with a conduction band offsets of 0.84 +/- 0.2 ev and 0.40 +/- 0.2 ev. the difference of valence band offsets of them mainly attributes to the spontaneous polarization effect. our results show important face dependence for inn/zno heterojunctions, and the valence band offset of a-plane heterojunction is more close to the "intrinsic" valence band offset. |
WOS关键词 | INN ; SEMICONDUCTORS ; SAPPHIRE ; SURFACES ; GROWTH ; ZNO |
WOS研究方向 | Physics |
WOS类目 | Physics, Applied |
语种 | 英语 |
WOS记录号 | WOS:000265823300075 |
出版者 | AMER INST PHYSICS |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2427644 |
专题 | 半导体研究所 |
通讯作者 | Yang, A. L. |
作者单位 | Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Yang, A. L.,Song, H. P.,Wei, H. Y.,et al. Measurement of polar c-plane and nonpolar a-plane inn/zno heterojunctions band offsets by x-ray photoelectron spectroscopy[J]. Applied physics letters,2009,94(16):3. |
APA | Yang, A. L..,Song, H. P..,Wei, H. Y..,Liu, X. L..,Wang, J..,...&Wang, Z. G..(2009).Measurement of polar c-plane and nonpolar a-plane inn/zno heterojunctions band offsets by x-ray photoelectron spectroscopy.Applied physics letters,94(16),3. |
MLA | Yang, A. L.,et al."Measurement of polar c-plane and nonpolar a-plane inn/zno heterojunctions band offsets by x-ray photoelectron spectroscopy".Applied physics letters 94.16(2009):3. |
入库方式: iSwitch采集
来源:半导体研究所
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