Effect of interface roughness and well width on differential reflection dynamics in ingaas/inp quantum wells
文献类型:期刊论文
作者 | Zhao, YG; Zou, YH; Wang, JJ; Qin, YD; Huang, XL; Masut, RA; Bensaada, A |
刊名 | Applied physics letters
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出版日期 | 1998-01-05 |
卷号 | 72期号:1页码:97-99 |
ISSN号 | 0003-6951 |
通讯作者 | Zhao, yg(yiguang@ibm320h.phy.pku.edu.cn) |
英文摘要 | We have observed differential reflection dynamics in in0.518ga0.492as/inp multiple quantum wells, using the pump-probe technique, and examined the photoluminescence spectra to determine the interface quality for the samples studied. our results show that the interface quality and well width of the quantum wells (qws) strongly influence the differential reflection dynamics. the experimental results provide a direct evidence to demonstrate that photoexcited carrier diffusion in cap layer and barriers along the direction perpendicular to sample surface plays a dominant role in determining the differential reflection dynamics of the qws. (c) 1998 american institute of physics. |
WOS关键词 | ALLOY ; TRANSPORT ; DIFFUSION |
WOS研究方向 | Physics |
WOS类目 | Physics, Applied |
语种 | 英语 |
WOS记录号 | WOS:000071324400034 |
出版者 | AMER INST PHYSICS |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2428595 |
专题 | 半导体研究所 |
通讯作者 | Zhao, YG |
作者单位 | 1.Beijing Univ, Dept Phys, Beijing 100871, Peoples R China 2.Beijing Univ, Mesoscop Phys Lab, Beijing 100871, Peoples R China 3.Natl Lab Superlattices & Microstruct, Beijing 100083, Peoples R China 4.Ecole Polytech, Dept Genie Phys, Quebec City, PQ H3C 3A7, Canada 5.Ecole Polytech, Grp Rech Phys & Technol Couches Minces, Quebec City, PQ H3C 3A7, Canada |
推荐引用方式 GB/T 7714 | Zhao, YG,Zou, YH,Wang, JJ,et al. Effect of interface roughness and well width on differential reflection dynamics in ingaas/inp quantum wells[J]. Applied physics letters,1998,72(1):97-99. |
APA | Zhao, YG.,Zou, YH.,Wang, JJ.,Qin, YD.,Huang, XL.,...&Bensaada, A.(1998).Effect of interface roughness and well width on differential reflection dynamics in ingaas/inp quantum wells.Applied physics letters,72(1),97-99. |
MLA | Zhao, YG,et al."Effect of interface roughness and well width on differential reflection dynamics in ingaas/inp quantum wells".Applied physics letters 72.1(1998):97-99. |
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来源:半导体研究所
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