中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Structural characterization of epitaxial lateral overgrown gan on patterned gan/gaas(001) substrates

文献类型:期刊论文

作者Shen, XM; Fu, Y; Feng, G; Zhang, BS; Feng, ZH; Wang, YT; Yang, H
刊名Journal of crystal growth
出版日期2002-12-01
卷号246期号:1-2页码:69-72
关键词Transmission electron microscopy X-ray diffraction Epitaxial lateral overgrowth Metalorganic vapor phase epitaxy Cubic gallium nitride
ISSN号0022-0248
通讯作者Shen, xm()
英文摘要Epitaxial lateral overgrown (elo) cubic gan (c-gan) on sio2 patterned gan/gaas(0 0 1) substrates by metalorganic vapor phase epitaxy was investigated using transmission electron microscopy and x-ray diffraction (xrd) measurements. the density of stacking faults (sfs) in elo c-gan was similar to6 x 10(8) cm(-2), while that in underlying gan template was similar to5 x 10(9) cm(-2). xrd measurements showed that the full-width at half-maximum of c-gan (0 0 2) rocking curve decreased from 33 to 17.8 arcmin, indicating the improved crystalline quality of elo c-gan. the mechanism of sf reduction in elo c-gan was also discussed. (c) 2002 elsevier science b.v. all rights reserved.
WOS关键词CHEMICAL-VAPOR-DEPOSITION ; CUBIC GAN ; PHASE EPITAXY ; REDUCTION ; GROWTH
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
语种英语
WOS记录号WOS:000179179600010
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2429147
专题半导体研究所
通讯作者Shen, XM
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Shen, XM,Fu, Y,Feng, G,et al. Structural characterization of epitaxial lateral overgrown gan on patterned gan/gaas(001) substrates[J]. Journal of crystal growth,2002,246(1-2):69-72.
APA Shen, XM.,Fu, Y.,Feng, G.,Zhang, BS.,Feng, ZH.,...&Yang, H.(2002).Structural characterization of epitaxial lateral overgrown gan on patterned gan/gaas(001) substrates.Journal of crystal growth,246(1-2),69-72.
MLA Shen, XM,et al."Structural characterization of epitaxial lateral overgrown gan on patterned gan/gaas(001) substrates".Journal of crystal growth 246.1-2(2002):69-72.

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来源:半导体研究所

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