Carrier concentration profiling in magnetic gamnsb/gasb investigated by electrochemistry capacitance-voltage profiler
文献类型:期刊论文
作者 | Zhang, XL; Zhang, FQ; Song, SL; Chen, NF; Wang, ZG; Lin, LY |
刊名 | Chinese science bulletin
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出版日期 | 2002-11-01 |
卷号 | 47期号:21页码:1780-1782 |
关键词 | Electrochemistry c-v Magnetic semiconductor Gamnsb |
ISSN号 | 1001-6538 |
通讯作者 | Zhang, xl() |
英文摘要 | Depth profiles of carrier concentrations in gamnsb/gasb are investigated by electrochemistry capacitance-voltage profiler and electrolyte of tiron. the carrier concentration in gamnsb/gasb measured by this method is coincident with the results of hall and x-ray diffraction measurements. it is indicated that most of the mn atoms in gamnsb take the site of ga, play a role of acceptors, and provide shallow acceptor level(s). |
WOS关键词 | III-V SEMICONDUCTORS ; MAGNETOTRANSPORT PROPERTIES ; TRANSPORT-PROPERTIES ; (IN,MN)AS/(GA,AL)SB ; MAGNETORESISTANCE ; HETEROSTRUCTURES ; (GA,MN)AS ; GAAS |
WOS研究方向 | Science & Technology - Other Topics |
WOS类目 | Multidisciplinary Sciences |
语种 | 英语 |
WOS记录号 | WOS:000178754200004 |
出版者 | SCIENCE CHINA PRESS |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2429170 |
专题 | 半导体研究所 |
通讯作者 | Zhang, XL |
作者单位 | 1.Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China 2.Chinese Acad Sci, Inst Mech, Natl Micrograv Lab, Beijing 100080, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, XL,Zhang, FQ,Song, SL,et al. Carrier concentration profiling in magnetic gamnsb/gasb investigated by electrochemistry capacitance-voltage profiler[J]. Chinese science bulletin,2002,47(21):1780-1782. |
APA | Zhang, XL,Zhang, FQ,Song, SL,Chen, NF,Wang, ZG,&Lin, LY.(2002).Carrier concentration profiling in magnetic gamnsb/gasb investigated by electrochemistry capacitance-voltage profiler.Chinese science bulletin,47(21),1780-1782. |
MLA | Zhang, XL,et al."Carrier concentration profiling in magnetic gamnsb/gasb investigated by electrochemistry capacitance-voltage profiler".Chinese science bulletin 47.21(2002):1780-1782. |
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来源:半导体研究所
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