中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study on the internal reflection of the multimode-interference-type device

文献类型:期刊论文

作者Lin, Y; Liu, YL; Wang, QM
刊名Optical engineering
出版日期2004-10-01
卷号43期号:10页码:2322-2326
关键词Multimode-interference-type device Internal reflection Bidirectional beam propagation method Taper
ISSN号0091-3286
DOI10.1117/1.1789987
通讯作者Lin, y(lyang@red.semi.ac.cn)
英文摘要The internal reflection of the multimode-interference (mmi)-type device is calculated with the bidirectional beam propagation method. the calculated results indicate that the difference of the effective refractive indices between the core region and the surrounding region has a determining effect on the internal reflection of the mmi-type device. the output taper for the mmi-type combiner and splitter has a more evident effect on the internal reflection than the input taper. the internal reflection decreases with increasing the end width of the taper. for the mmi-type device with appropriate tapers, the internal reflection does not show evident degradation with the deviation of the length of the mmi region from its optimal value. (c) 2004 society of photo-optical instrumentation engineers.
WOS关键词COUPLERS
WOS研究方向Optics
WOS类目Optics
语种英语
WOS记录号WOS:000224814800023
出版者SPIE-INT SOCIETY OPTICAL ENGINEERING
URI标识http://www.irgrid.ac.cn/handle/1471x/2429435
专题半导体研究所
通讯作者Lin, Y
作者单位Chinese Acad Sci, State Key Lab Integrated Optoelect, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Lin, Y,Liu, YL,Wang, QM. Study on the internal reflection of the multimode-interference-type device[J]. Optical engineering,2004,43(10):2322-2326.
APA Lin, Y,Liu, YL,&Wang, QM.(2004).Study on the internal reflection of the multimode-interference-type device.Optical engineering,43(10),2322-2326.
MLA Lin, Y,et al."Study on the internal reflection of the multimode-interference-type device".Optical engineering 43.10(2004):2322-2326.

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来源:半导体研究所

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