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A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds

文献类型：期刊论文

作者Lin, Shui-chao3,4; Wu, Xiao-hu1; Xie, Hua1; Liu, Zhi-ling2; Su, Hai-feng3,4; Tang, Zi-chao1,3,4
刊名CHINESE JOURNAL OF CHEMICAL PHYSICS
出版日期2016-08-01
卷号29期号:4页码:401-406
ISSN号1674-0068
关键词Nano-electrospray Ionization Source Ion transmissIon And Focus System Reflectron Time-of-flight Mass Spectrometer Metal Cluster Compounds Single Crystal X-ray Diffraction
DOI10.1063/1674-0068/29/cjcp1601019
文献子类Article
英文摘要An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-flight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the "ionization" process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au-20(PPhPy2)(10)Cl-2](SbF6)(4), where PPhpy(2)=bis (2-pyridyl)phenylphosphine, and [Au6Ag2(C)L-6](BF4)(4), where L=2-(diphenylphosphino)-5-methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determinated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds.
WOS关键词GOLD CLUSTERS ; ION-SOURCE ; NANOCLUSTERS ; NANOMOLECULES ; INTERFACE ; MOTIF
WOS研究方向Physics
语种英语
出版者CHINESE PHYSICAL SOC
WOS记录号WOS:000383114400001
源URL[http://cas-ir.dicp.ac.cn/handle/321008/170258]  
专题大连化学物理研究所_中国科学院大连化学物理研究所
通讯作者Tang, Zi-chao
作者单位1.Chinese Acad Sci, State Key Lab Mol React Dynam, Dalian Inst Chem Phys, Dalian 116023, Peoples R China
2.Shanxi Normal Univ, Sch Chem & Mat Sci, Linfen 041004, Peoples R China
3.Xiamen Univ, State Key Lab Phys Chem Solid Surfaces, Collaborat Innovat Ctr Chem Energy Mat, Xiamen 361005, Peoples R China
4.Xiamen Univ, Dept Chem, Coll Chem & Chem Engn, Xiamen 361005, Peoples R China
推荐引用方式
GB/T 7714		 Lin, Shui-chao,Wu, Xiao-hu,Xie, Hua,et al. A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds[J]. CHINESE JOURNAL OF CHEMICAL PHYSICS,2016,29(4):401-406.
APA Lin, Shui-chao,Wu, Xiao-hu,Xie, Hua,Liu, Zhi-ling,Su, Hai-feng,&Tang, Zi-chao.(2016).A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds.CHINESE JOURNAL OF CHEMICAL PHYSICS,29(4),401-406.
MLA Lin, Shui-chao,et al."A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds".CHINESE JOURNAL OF CHEMICAL PHYSICS 29.4(2016):401-406.

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来源：大连化学物理研究所

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