中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Flatness measurement of large flat with two-station laser trackers

文献类型:期刊论文

作者Li, Jie; Yang, Jie; Wu, Shibin; Cao, Xuedong
刊名INTERNATIONAL JOURNAL OF OPTOMECHATRONICS
出版日期2018
卷号12期号:1页码:53-62
ISSN号1559-9612
关键词Flatness measurement large-scale metrology error compensation coordinate measuring machine laser tracker
DOI10.1080/15599612.2018.1529846
文献子类J
英文摘要We present a novel method to accurately measure the flatness of a large flat. The method can be seen as a task-specific error correction of the laser tracker. Laser trackers are positioned at two specific measuring stations and measure the coordinates of the same sample points. The angular errors of the primary laser tracker are compensated with constraint information provided by an additional laser tracker. Using this method, we measure the flatness of a 4.5m flat. The flatness measurement uncertainty is 1.4 mu m in rms (root mean square).
语种英语
WOS记录号WOS:000455367600001
源URL[http://ir.ioe.ac.cn/handle/181551/9291]  
专题光电技术研究所_质量处(质检中心)
作者单位Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China
推荐引用方式
GB/T 7714
Li, Jie,Yang, Jie,Wu, Shibin,et al. Flatness measurement of large flat with two-station laser trackers[J]. INTERNATIONAL JOURNAL OF OPTOMECHATRONICS,2018,12(1):53-62.
APA Li, Jie,Yang, Jie,Wu, Shibin,&Cao, Xuedong.(2018).Flatness measurement of large flat with two-station laser trackers.INTERNATIONAL JOURNAL OF OPTOMECHATRONICS,12(1),53-62.
MLA Li, Jie,et al."Flatness measurement of large flat with two-station laser trackers".INTERNATIONAL JOURNAL OF OPTOMECHATRONICS 12.1(2018):53-62.

入库方式: OAI收割

来源:光电技术研究所

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