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Development of single-event-effects analysis system at the IMP microbeam facility

文献类型：期刊论文

作者Du, Guanghua1; Bi, Jinshun2; Ma, Shuyi3; Liu, Xiaojun1; Sheng, Lina1; Li, Yaning1; Wei, Junze1; Chen, Hao1; Wu, Ruqun1; Liu, Wenjing1
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
出版日期2017-08-01
卷号404页码:250-253
ISSN号0168-583X
DOI10.1016/j.nimb.2017.02.012
英文摘要Single-event-effects (SEEs) in integrated circuits (ICs) caused by galactic single ions are the major cause of anomalies for a spacecraft. The main strategies to decrease radiation failures for spacecraft are using SEEs less-sensitive devices and design radiation hardened ICs. High energy ion microbeam is one of the powerful tools to obtain spatial information of SEEs in ICs and to guide the radiation hardening design. The microbeam facility in the Institute of Modern Physics (IMP), Chinese Academy of Science (CAS) can meet both the liner energy transfer (LET) and ion range requirements for SEEs simulation experiments on ground. In order to study SEEs characteristics of ICs at this microbeam platform, a SEEs analysis system was developed. This system can target and irradiate ICs with single ions in micrometer-scale accuracy, meanwhile it acquires multi-channel SEE signals and maps the SEE sensitive regions online. A 4-Mbit NOR Flash memory was tested with this system using 2.2 GeV Kr ions, the radiation sensitive peripheral circuit regions for SEEs of 1 to 0 and 0 to 1 upset, multi-bit-upset and single event latchup have been obtained. (C) 2017 Elsevier B.V. All rights reserved.
WOS关键词FLASH MEMORY ; ANOMALIES ; NAND
资助项目National Natural Science Foundation of China (NSFC)[U1632271] ; National Natural Science Foundation of China (NSFC)[11505254] ; National Natural Science Foundation of China (NSFC)[61634008] ; Ministry of Science and Technology[2012YQ03014204]
WOS研究方向Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
语种英语
WOS记录号WOS:000404709900047
出版者ELSEVIER SCIENCE BV
资助机构National Natural Science Foundation of China (NSFC) ; Ministry of Science and Technology
源URL[http://119.78.100.186/handle/113462/45136]  
专题近代物理研究所_实验物理中心
通讯作者Du, Guanghua
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou, Peoples R China
2.Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China
3.Northwest Normal Univ, Lanzhou, Peoples R China
推荐引用方式
GB/T 7714		 Du, Guanghua,Bi, Jinshun,Ma, Shuyi,et al. Development of single-event-effects analysis system at the IMP microbeam facility[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2017,404:250-253.
APA Du, Guanghua.,Bi, Jinshun.,Ma, Shuyi.,Liu, Xiaojun.,Sheng, Lina.,...&Guo, Jinlong.(2017).Development of single-event-effects analysis system at the IMP microbeam facility.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,404,250-253.
MLA Du, Guanghua,et al."Development of single-event-effects analysis system at the IMP microbeam facility".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 404(2017):250-253.

入库方式： OAI收割

来源：近代物理研究所

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