机构

• 近代物理研究所 [8]
• 微电子研究所 [3]
• 新疆理化技术研究所 [1]

采集方式

• OAI收割 [12]

内容类型

• 期刊论文 [9]
• 会议论文 [3]

发表日期

• 2019 [3]
• 2018 [4]
• 2017 [3]
• 2016 [1]
• 2015 [1]

学科主题

筛选

浏览/检索结果: 共12条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Charge trapping effect in HfO2-based high-k gate dielectric stacks after heavy ion irradiation: The role of oxygen vacancy 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 459, 页码: 143-147 作者:  Li, Zongzhen;  Liu, Tianqi;  Bi, Jinshun;  Yao, Huijun;  Zhang, Zhenxing   |  收藏  |  浏览/下载：15/0  |  提交时间：2022/01/19 High-k HfO2  Heavy ion irradiation  Reliability  Charge trapping  Oxygen vacancy   Latent Reliability Degradation of Ultrathin Amorphous HfO2 Dielectric After Heavy Ion Irradiation: The Impact of Nano-Crystallization 期刊论文  OAI收割 IEEE ELECTRON DEVICE LETTERS, 2019, 卷号: 40, 期号: 10, 页码: 1634-1637 作者:  Li, Zongzhen;  Liu, Jie;  Zhai, Pengfei;  Liu, Tianqi;  Bi, Jinshun   |  收藏  |  浏览/下载：15/0  |  提交时间：2022/01/19 HfO2  heavy ion irradiation  reliability degradation  crystallization   The total ionizing dose effects of X-ray irradiation on graphene/Si Schottky diodes with a HfO2 insertion layer 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2019, 卷号: 100, 期号: 9, 页码: 1-5 作者:     |  收藏  |  浏览/下载：15/0  |  提交时间：2020/01/19 A Single Event Upset Tolerant Latch Design 期刊论文  OAI收割 Microelectronics Reliability, 2018 作者:  Haibin Wang;  Xixi Dai;  Yangsheng Wang;  Issam Nofal;  Li Cai   |  收藏  |  浏览/下载：27/0  |  提交时间：2019/04/12 Study of γ-ray irradiation influence on TiN/HfO 2 /Si MOS capacitor by C-V and DLTS 期刊论文  OAI收割 Superlattices and Microstructures, 2018 作者:  Yun Li;  Yao Ma   |  收藏  |  浏览/下载：37/0  |  提交时间：2019/04/18 The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018 作者:  Song Gu;  Jie Liu;  Jinshun Bi;  Fazhan Zhao;  zhangang Zhang   |  收藏  |  浏览/下载：11/0  |  提交时间：2019/04/12 The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1091-1100 作者:  Gu, Song;  Liu, Jie;  Bi, Jinshun;  Zhao, Fazhan;  Zhang, Zhangang   |  收藏  |  浏览/下载：23/0  |  提交时间：2018/07/16 Energy dependence  heavy ions  nuclear reactions  silicon-on-insulator (SOI) technology  single event upset (SEU)   Development of single-event-effects analysis system at the IMP microbeam facility 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 250-253 作者:  Du, Guanghua;  Bi, Jinshun;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina   |  收藏  |  浏览/下载：26/0  |  提交时间：2018/05/31 Development of single-event-effects analysis system at the IMP microbeam facility 会议论文  OAI收割 作者:  Guo, Jinlong;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina;  Li, Yaning   |  收藏  |  浏览/下载：20/0  |  提交时间：2018/08/20 Development of single-event-effects analysis system at the IMP microbeam facility 会议论文  OAI收割 作者:  Sheng, Lina;  Guo, Jinlong;  Du, Guanghua;  Bi, Jinshun;  Liu, Wenjing   |  收藏  |  浏览/下载：25/0  |  提交时间：2018/08/20