Development of single-event-effects analysis system at the IMP microbeam facility
文献类型：会议论文
| 作者 | Sheng, Lina2 ; Guo, Jinlong1,2; Du, Guanghua2; Bi, Jinshun3; Liu, Wenjing2; Wu, Ruqun2; Chen, Hao2; Wei, Junze2; Li, Yaning2; Liu, Xiaojun2
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| 出版日期 | 2017-08 |
| 卷号 | 404 |
| DOI | 10.1016/j.nimb.2017.02.012 |
| 页码 | 250-253 |
| 英文摘要 | Single-event-effects (SEEs) in integrated circuits (ICs) caused by galactic single ions are the major cause of anomalies for a spacecraft. The main strategies to decrease radiation failures for spacecraft are using SEEs less-sensitive devices and design radiation hardened ICs. High energy ion microbeam is one of the powerful tools to obtain spatial information of SEEs in ICs and to guide the radiation hardening design. The microbeam facility in the Institute of Modern Physics (IMP), Chinese Academy of Science (CAS) can meet both the liner energy transfer (LET) and ion range requirements for SEEs simulation experiments on ground. In order to study SEEs characteristics of ICs at this microbeam platform, a SEEs analysis system was developed. This system can target and irradiate ICs with single ions in micrometer-scale accuracy, meanwhile it acquires multi-channel SEE signals and maps the SEE sensitive regions online. A 4-Mbit NOR Flash memory was tested with this system using 2.2 GeV Kr ions, the radiation sensitive peripheral circuit regions for SEEs of 1 to 0 and 0 to 1 upset, multi-bit-upset and single event latchup have been obtained. (C) 2017 Elsevier B.V. All rights reserved. |
| 会议录 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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| 会议录出版者 | ELSEVIER SCIENCE BV |
| 会议录出版地 | PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
| 语种 | 英语 |
| 资助项目 | Ministry of Science and Technology[2012YQ03014204] |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| WOS记录号 | WOS:000404709900047 |
| 源URL | [http://119.78.100.186/handle/113462/58069]  |
| 专题 | 近代物理研究所_实验物理中心 |
| 通讯作者 | Du, Guanghua |
| 作者单位 | 1.Northwest Normal Univ, Lanzhou, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou, Peoples R China 3.Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Sheng, Lina,Guo, Jinlong,Du, Guanghua,et al. Development of single-event-effects analysis system at the IMP microbeam facility[C]. 见:. |
入库方式： OAI收割
来源：近代物理研究所
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