A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
文献类型：期刊论文
| 作者 | Ceng CB(曾传滨); Zhao FZ(赵发展); Yan WW(闫薇薇) |
| 刊名 | Nuclear Instruments and Methods in Physics Research B
 |
| 出版日期 | 2017-09-15 |
| 文献子类 | 期刊论文 |
| 源URL | [http://159.226.55.106/handle/172511/18029]  |
| 专题 | 微电子研究所_硅器件与集成研发中心 |
| 推荐引用方式 GB/T 7714 | Ceng CB,Zhao FZ,Yan WW. A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM[J]. Nuclear Instruments and Methods in Physics Research B,2017. |
| APA | 曾传滨,赵发展,&闫薇薇.(2017).A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM.Nuclear Instruments and Methods in Physics Research B. |
| MLA | 曾传滨,et al."A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM".Nuclear Instruments and Methods in Physics Research B (2017). |
入库方式： OAI收割
来源：微电子研究所
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