Investigation on the Robustness During Short-Circuit Turn-off and Its Tradeoff Characteristics With Performance in IGBTs
文献类型：期刊论文
| 作者 | Yang F(杨飞); Zhu YJ(朱阳军); Lu SJ(卢烁今); Tan J(谭骥) |
| 刊名 | IEEE Transactions on Electron Devices
 |
| 出版日期 | 2017-06-27 |
| 文献子类 | 期刊论文 |
| 源URL | [http://159.226.55.106/handle/172511/17998]  |
| 专题 | 微电子研究所_高频高压器件与集成研发中心 |
| 推荐引用方式 GB/T 7714 | Yang F,Zhu YJ,Lu SJ,et al. Investigation on the Robustness During Short-Circuit Turn-off and Its Tradeoff Characteristics With Performance in IGBTs[J]. IEEE Transactions on Electron Devices,2017. |
| APA | 杨飞,朱阳军,卢烁今,&谭骥.(2017).Investigation on the Robustness During Short-Circuit Turn-off and Its Tradeoff Characteristics With Performance in IGBTs.IEEE Transactions on Electron Devices. |
| MLA | 杨飞,et al."Investigation on the Robustness During Short-Circuit Turn-off and Its Tradeoff Characteristics With Performance in IGBTs".IEEE Transactions on Electron Devices (2017). |
入库方式： OAI收割
来源：微电子研究所
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