中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Integrated micromachined thermopile IR detectors with an XeF2 dry-etching process

文献类型:期刊论文

作者Xu, DH ; Xiong, B ; Wang, YL ; Liu, MF ; Li, T
刊名JOURNAL OF MICROMECHANICS AND MICROENGINEERING
出版日期2009
卷号19期号:12页码:125003-125003
关键词CMOS SENSORS SILICON SI
ISSN号0960-1317
通讯作者Xu, DH, Chinese Acad Sci, State Key Lab Transducer Technol, Shanghai Inst Microsyst & Informat Technol, 865 Changning Rd, Shanghai 200050, Peoples R China
学科主题Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Instruments & Instrumentation; Materials Science, Multidisciplinary; Mechanics
收录类别SCI
语种英语
公开日期2011-12-17
源URL[http://ir.sim.ac.cn/handle/331004/38445]  
专题上海微系统与信息技术研究所_微系统技术_期刊论文
推荐引用方式
GB/T 7714
Xu, DH,Xiong, B,Wang, YL,et al. Integrated micromachined thermopile IR detectors with an XeF2 dry-etching process[J]. JOURNAL OF MICROMECHANICS AND MICROENGINEERING,2009,19(12):125003-125003.
APA Xu, DH,Xiong, B,Wang, YL,Liu, MF,&Li, T.(2009).Integrated micromachined thermopile IR detectors with an XeF2 dry-etching process.JOURNAL OF MICROMECHANICS AND MICROENGINEERING,19(12),125003-125003.
MLA Xu, DH,et al."Integrated micromachined thermopile IR detectors with an XeF2 dry-etching process".JOURNAL OF MICROMECHANICS AND MICROENGINEERING 19.12(2009):125003-125003.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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