中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A heater-integrated scanning probe microscopy probe array with different tip radii for study of micro-nanosize effects on silicon-tip/polymer-film friction

文献类型:期刊论文

作者Bao, HF ; Li, XX
刊名REVIEW OF SCIENTIFIC INSTRUMENTS
出版日期2008
卷号79期号:3页码:33701-33701
关键词ATOMIC-FORCE MICROSCOPE GLASS-TRANSITION TEMPERATURE POLYMER-FILMS POLY(METHYL METHACRYLATE) CANTILEVERS THICKNESS DYNAMICS
ISSN号0034-6748
通讯作者Li, XX, Chinese Acad Sci, State Key Lab Transducer Technol, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
学科主题Instruments & Instrumentation; Physics, Applied
收录类别SCI
语种英语
公开日期2011-12-17
源URL[http://ir.sim.ac.cn/handle/331004/38569]  
专题上海微系统与信息技术研究所_微系统技术_期刊论文
推荐引用方式
GB/T 7714
Bao, HF,Li, XX. A heater-integrated scanning probe microscopy probe array with different tip radii for study of micro-nanosize effects on silicon-tip/polymer-film friction[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2008,79(3):33701-33701.
APA Bao, HF,&Li, XX.(2008).A heater-integrated scanning probe microscopy probe array with different tip radii for study of micro-nanosize effects on silicon-tip/polymer-film friction.REVIEW OF SCIENTIFIC INSTRUMENTS,79(3),33701-33701.
MLA Bao, HF,et al."A heater-integrated scanning probe microscopy probe array with different tip radii for study of micro-nanosize effects on silicon-tip/polymer-film friction".REVIEW OF SCIENTIFIC INSTRUMENTS 79.3(2008):33701-33701.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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