The complex correlation between current density and pore density based on non-SCR effects
文献类型：期刊论文
| 作者 | Bao, XQ ; Jiao, JW ; Wang, YL |
| 刊名 | ELECTROCHEMISTRY COMMUNICATIONS
 |
| 出版日期 | 2007 |
| 卷号 | 9期号:8页码:1991-1997 |
| 关键词 | N-TYPE SILICON POROUS SILICON MACROPORE FORMATION STABILITY ANALYSIS MORPHOLOGY PHYSICS MECHANISM LIMITS |
| ISSN号 | 1388-2481 |
| 通讯作者 | Jiao, JW, Chinese Acad Sci, Shanghai Inst Microsyst & Informat, Natl Key Lab Microsyst Technol, State Key Lab Transducer Technol, Shanghai 200050, Peoples R China |
| 学科主题 | Electrochemistry |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2011-12-17 |
| 源URL | [http://ir.sim.ac.cn/handle/331004/38640]  |
| 专题 | 上海微系统与信息技术研究所_微系统技术_期刊论文 |
| 推荐引用方式 GB/T 7714 | Bao, XQ,Jiao, JW,Wang, YL. The complex correlation between current density and pore density based on non-SCR effects[J]. ELECTROCHEMISTRY COMMUNICATIONS,2007,9(8):1991-1997. |
| APA | Bao, XQ,Jiao, JW,&Wang, YL.(2007).The complex correlation between current density and pore density based on non-SCR effects.ELECTROCHEMISTRY COMMUNICATIONS,9(8),1991-1997. |
| MLA | Bao, XQ,et al."The complex correlation between current density and pore density based on non-SCR effects".ELECTROCHEMISTRY COMMUNICATIONS 9.8(2007):1991-1997. |
入库方式： OAI收割
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