中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A Discretization Algorithm of Continuous Attributes Based on Supervised Clustering

文献类型:会议论文

作者Hua HY(花海洋); Zhao HC(赵怀慈)
出版日期2009
会议名称Chinese Conference on Pattern Recognition/1st CJK Joint Workshop on Pattern Recognition
会议日期November 4-6, 2009
会议地点Nanjing, China
关键词Data mining discretization classification supervised clustering
页码40307
中文摘要Many machine learning algorithms can be applied only to data described by categorical attributes. So discretizatioti of continuous attributes is one of the important steps in preprocessing of extracting knowledge. Traditional discretization algorithms based on clustering need a pre-determined clustering number k, also typically are applied in an unsupervised learning framework. This paper describes such an algorithm, called SX-means (Supervised X-means), which is a new algorithm of supervised discretization of continuous attributes on clustering. The algorithm modifies clusters with knowledge of the class distribution dynamically. And this procedure can not stop until the proper k is found. For the number of clusters k is not pre-determined by the user and class distribution is applied, the random of result is decreased greatly. Experimental evaluation of several discretization algorithms on six artificial data sets show that the proposed algorithm is more efficient and can generate a better discretization schema. Comparing the output of C4.5, resulting tree is smaller, less classification rules, and high accuracy of classification.
收录类别EI ; CPCI(ISTP)
产权排序1
会议录PROCEEDINGS OF THE 2009 CHINESE CONFERENCE ON PATTERN RECOGNITION AND THE FIRST CJK JOINT WORKSHOP ON PATTERN RECOGNITION, VOLS 1 AND 2
会议录出版者IEEE
会议录出版地NEW YORK
语种英语
ISBN号978-1-4244-4199-0
WOS记录号WOS:000278039800002
源URL[http://ir.sia.cn/handle/173321/7936]  
专题沈阳自动化研究所_光电信息技术研究室
推荐引用方式
GB/T 7714
Hua HY,Zhao HC. A Discretization Algorithm of Continuous Attributes Based on Supervised Clustering[C]. 见:Chinese Conference on Pattern Recognition/1st CJK Joint Workshop on Pattern Recognition. Nanjing, China. November 4-6, 2009.

入库方式: OAI收割

来源:沈阳自动化研究所

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