中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Artificial immune pattern recognition for damage detection in structural health monitoring sensor networks

文献类型:会议论文

作者Chen B(陈波); Zang CZ(臧传治)
出版日期2009
会议名称SmaRT Sensor Phenomena, Technology, Networks, and Systems 2009
会议日期March 9-11, 2009
会议地点San Diego, CA, United states
关键词Artificial immune pattern recognition structural health monitoring structure damage classification
页码72930K
中文摘要This paper presents an artificial immune pattern recognition (AIPR) approach for the damage detection and classification in structures. An AIPR-based Structure Damage Classifier (AIPR-SDC) has been developed by mimicking immune recognition and learning mechanisms. The structure damage patterns are represented by feature vectors that are extracted from the structure's dynamic response measurements. The training process is designed based on the clonal selection principle in the immune system. The selective and adaptive features of the clonal selection algorithm allow the classifier to generate recognition feature vectors that are able to match the training data. In addition, the immune learning algorithm can learn and remember various data patterns by generating a set of memory cells that contains representative feature vectors for each class (pattern). The performance of the presented structure damage classifier has been validated using a benchmark structure proposed by the IASC-ASCE (International Association for Structural Control - American Society of Civil Engineers) Structural Health Monitoring Task Group. The validation results show a better classification success rate comparing to some of other classification algorithms.
收录类别EI
产权排序2
会议主办者SPIE
会议录Proc. SPIE
会议录出版者SPIE
会议录出版地BELLINGHAM
语种英语
源URL[http://ir.sia.cn/handle/173321/8334]  
专题沈阳自动化研究所_工业信息学研究室
推荐引用方式
GB/T 7714
Chen B,Zang CZ. Artificial immune pattern recognition for damage detection in structural health monitoring sensor networks[C]. 见:SmaRT Sensor Phenomena, Technology, Networks, and Systems 2009. San Diego, CA, United states. March 9-11, 2009.

入库方式: OAI收割

来源:沈阳自动化研究所

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