中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Neural Network Predictive R2R Control to CMP Process

文献类型:会议论文

作者Wang L(王亮); Hu JT(胡静涛)
出版日期2011
会议名称2011 4th IEEE International Conference on Computer Science and Information Technology
会议日期June 10-12, 2011
会议地点Chengdu, China
关键词chemical mechanical polishing RBF neural network predictive control run-to-run control PSO rolling optimization
页码9-13
中文摘要For chemical mechanical polishing(CMP)process characteristics of nonlinear, time-varying and not being in-situ measured, this paper proposes a CMP process neural network predictive run-to-run(R2R) controller named NNPR2R. RBF neural network predictive model about CMP is constructed by subtractive clustering algorithm and least squares method, thus it solves difficult problem of constructing accurate mathematical model of complicated CMP process and improves the prediction accuracy. Control law of model predictive control is obtained by feedback correction and PSO rolling optimization, therefore it solves the problem that derivative-based optimization technology is easy to fall into local optimum and improves control precision. Simulation results illustrate that performance of NNPR2R controller is better than EWMA, process drifts and shifts is suppressed significantly, product quality variation between different runs is reduced, and root mean squared error for material removal rate(MRR) is brought down substantially.
产权排序1
会议主办者IEEE
会议录2011 4th IEEE International Conference on Computer Science and Information Technology
会议录出版者IEEE
会议录出版地Piscataway, NJ
语种英语
ISBN号978-1-61284-836-5
源URL[http://ir.sia.cn/handle/173321/8376]  
专题沈阳自动化研究所_工业信息学研究室
推荐引用方式
GB/T 7714
Wang L,Hu JT. Neural Network Predictive R2R Control to CMP Process[C]. 见:2011 4th IEEE International Conference on Computer Science and Information Technology. Chengdu, China. June 10-12, 2011.

入库方式: OAI收割

来源:沈阳自动化研究所

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